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Title:
INSPECTION DEVICE AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/163859
Kind Code:
A1
Abstract:
This inspection device comprises an infrared acquisition unit for acquiring infrared light detected by an infrared camera for detecting infrared light from an inspected object that includes an electroconductive member, an intensity-determining unit for determining the detection intensity of the infrared light, and a scratch-determining unit for determining whether or not there is a scratch on the electroconductive member on the basis of the detection intensity of the infrared light.

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Inventors:
YANO YUKI (JP)
KAMIHARA NOBUYUKI (JP)
MORITAKE TAKAYUKI (JP)
KAWAZOE KOHEI (JP)
NAKAJIMA KIWAMU (JP)
MURAKI TOSHINOBU (JP)
HASHIDA YUSUKE (JP)
FUJII KANATA (JP)
Application Number:
PCT/JP2022/003703
Publication Date:
August 04, 2022
Filing Date:
January 31, 2022
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND LTD (JP)
International Classes:
G01N21/958
Foreign References:
CN106383127A2017-02-08
JPH01113641A1989-05-02
JPH06229933A1994-08-19
JP2006349647A2006-12-28
JPH09273997A1997-10-21
JP2000314707A2000-11-14
JP2000055815A2000-02-25
JP2014002025A2014-01-09
JP2015081826A2015-04-27
JP2017120232A2017-07-06
JP2016004020A2016-01-12
US20100124600A12010-05-20
JPH11191373A1999-07-13
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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