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Patent Searching and Data


Title:
INSPECTION DEVICE, PTP PACKAGING MACHINE, AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/187253
Kind Code:
A1
Abstract:
Provided are an inspection device, PTP packaging machine, and inspection method capable of enhancing the accuracy of inspection using spectral analysis. The inspection device 22 comprises an illumination device 52 capable of irradiating near-infrared light onto a tablet 5 and an imaging device 53 capable of dispersing and imaging reflected light reflected by the tablet 5. The inspection device 22 acquires spectral data for the tablet 5 on the basis of spectral image data acquired by the imaging device 53 and makes a good/bad assessment of the tablet 5 through the determination of whether the spectral intensities of each wavelength band included in the spectral data are within allowable ranges. Further, the inspection device 22 sequentially stores the spectral data of tablets 5 assessed as being good, calculates average spectral intensity values for each wavelength band on the basis of the spectral data for a prescribed number of most recent good tablets 5, uses the average spectral intensity values to calculate thresholds for each wavelength band, and uses the thresholds to change the allowable ranges for each wavelength band.

Inventors:
TAGUCHI YUKIHIRO (JP)
Application Number:
PCT/JP2018/037408
Publication Date:
October 03, 2019
Filing Date:
October 05, 2018
Export Citation:
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Assignee:
CKD CORP (JP)
International Classes:
G01N21/90; A61J3/06; G01N21/359; G01N21/85
Domestic Patent References:
WO2015136620A12015-09-17
WO2013002291A12013-01-03
WO2017094188A12017-06-08
Foreign References:
JP2010112887A2010-05-20
JP2012037488A2012-02-23
JP2003017393A2003-01-17
JP2018185269A2018-11-22
JP2010016890A2010-01-21
Other References:
See also references of EP 3779413A4
Attorney, Agent or Firm:
KAWAGUCHI Mitsuo (JP)
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