Title:
INSPECTION SYSTEM AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/014536
Kind Code:
A1
Abstract:
An inspection system 3 uses radio waves to inspect the state of an object at low cost and efficiently, the foregoing possible as a result of the system comprising: a measurement unit 31 that measures reflected waves from an object 30 making a prescribed movement, the waves having been generated by projecting radio waves to the object 30; a moving body 32 that comprises the measurement unit 31 and moves so that the relative positional relationship between the measurement unit 31 and the object 30 changes with the passage of time; and a generation unit 33 that generates information representing the state of the object 30 by performing signal processing on a signal indicated by the reflected waves.
Inventors:
ARIYOSHI MASAYUKI (JP)
YAMANOUCHI SHINGO (JP)
OGURA KAZUMINE (JP)
SUMIYA TATSUYA (JP)
YAMANOUCHI SHINGO (JP)
OGURA KAZUMINE (JP)
SUMIYA TATSUYA (JP)
Application Number:
PCT/JP2019/028672
Publication Date:
January 28, 2021
Filing Date:
July 22, 2019
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01N22/00
Foreign References:
| JP2001501304A | 2001-01-30 | |||
| US20080110093A1 | 2008-05-15 | |||
| JP2012510625A | 2012-05-10 | |||
| US4586441A | 1986-05-06 | |||
| JPH0613210U | 1994-02-18 | |||
| JP2018124235A | 2018-08-09 | |||
| JP2005077344A | 2005-03-24 |
Attorney, Agent or Firm:
SHIMOSAKA Naoki (JP)
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