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Patent Searching and Data


Title:
INSPECTION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/178913
Kind Code:
A1
Abstract:
The present invention improves the accuracy of determination as to whether an object has a prescribed attribute. This inspection system includes: a machine learning device; a feature data acquisition unit; and a parameter update unit. The machine learning device determines, on the basis of feature data of a plurality of objects, whether the plurality of objects has a prescribed attribute. For objects that are among objects having been determined, by the machine learning device, as not having the prescribed attribute, but that has been determined, not by the machine learning device, as having the prescribed attribute, the feature data acquisition unit acquires the feature data. The parameter update unit updates a learning parameter of the machine learning device on the basis of teacher data which includes the feature data acquired by the feature data acquisition unit.

Inventors:
MASUMURA RYO (JP)
ADACHI MASARU (JP)
Application Number:
PCT/JP2019/008172
Publication Date:
September 10, 2020
Filing Date:
March 01, 2019
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Assignee:
YASKAWA ELECTRIC CORP (JP)
International Classes:
G06T7/00; G05B19/418
Domestic Patent References:
WO2016084336A12016-06-02
WO2018038123A12018-03-01
WO2018154562A12018-08-30
Attorney, Agent or Firm:
HARUKA PATENT & TRADEMARK ATTORNEYS (JP)
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