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Patent Searching and Data


Title:
INTERFERENCE EVALUATION METHOD, INTERFERENCE EVALUATION DEVICE, AND INTERFERENCE EVALUATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/189423
Kind Code:
A1
Abstract:
This interference evaluation method, which planarly evaluates a radio wave interference generated between a first wireless station and a second wireless station, includes: a distinguishing step for acquiring information indicating a topographical cross section of each azimuth with the first wireless station as the center, and distinguishing the topographical cross section into a section which has visibility from the location of the first wireless station and a section which does not have visibility from the location of the first wireless station; and a specification step for specifying, on the basis of the distance between the first wireless station and the second wireless station, a location at which an interference amount becomes a desired interference amount for the section determined as having visibility from the location of the first wireless station, and specifying the location at which the interference amount becomes the desired interference amount by evaluating the radio wave interference for each mesh of a region to be evaluated that is divided into mesh shapes for the section determined as not having visibility from the location of the first wireless station.

Inventors:
TSUBOI HIDEYUKI (JP)
TOSHINAGA HIDEKI (JP)
GOTO KAZUTO (JP)
SHIRATO YUSHI (JP)
KITA NAOKI (JP)
Application Number:
PCT/JP2020/010411
Publication Date:
September 24, 2020
Filing Date:
March 11, 2020
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
H04W16/18; H04W4/02; H04W24/06
Domestic Patent References:
WO2015159411A12015-10-22
Foreign References:
JP2018056790A2018-04-05
Other References:
HASE, YOSHIHIRO: "White Space Database with Radio Propagation Simulator Considering Terrestrial Topology", IEICE TECHNICAL REPORT, vol. 113, no. 457, 24 February 2014 (2014-02-24)
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
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