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Title:
ION BEAM IRRADIATION SYSTEM, ION BEAM PURITY MEASUREMENT METHOD, ION BEAM PURITY MEASUREMENT DEVICE, AND ION BEAM PURITY MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/039647
Kind Code:
A1
Abstract:
This ion beam irradiation system 1, which comprises an ion source 2 that extracts ions, a linear accelerator 4 and a circular accelerator 5 that accelerate the ions to generate an ion beam, an irradiation device 8 that performs irradiation with the ion beam accelerated by the accelerator, and a control device 10 that controls the accelerator and the irradiation device, comprises: a dose detection device 13 that detects the dose of the ion beam accelerated by the accelerator; a current detection device 14 that detects a current of the ion beam that has passed through the dose detection device; and a measurement processing unit 31 that measures the purity of the ion beam on the basis of a dose detection value of the dose detection device and a current detection value of the current detection device. Accordingly, impurity ions having the same mass-to-charge ratio as a target ion type in the irradiation with the ion beam can be detected.

Inventors:
MIZUSHIMA KOTA (JP)
IWATA YOSHIYUKI (JP)
Application Number:
PCT/JP2020/031680
Publication Date:
March 04, 2021
Filing Date:
August 21, 2020
Export Citation:
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Assignee:
NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECH (JP)
International Classes:
G01T1/29; A61N5/10; G21K5/04
Foreign References:
JP2015176814A2015-10-05
JP2013187057A2013-09-19
JP2015179632A2015-10-08
JP2018004455A2018-01-11
JPH05144408A1993-06-11
Attorney, Agent or Firm:
NISHIHARA, Hironori (JP)
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