The invention relates to analytical instrumentation, notably to devices with vortex gas motion for mass spectrometric analysis with atmospheric ion sources.

Mass spectrometers with ionization at a pressure higher than one for mass analysis are based on the principle of making ions outside of the vacuum region or in low vacuum region, e.g. region of atmospheric, higher or lower pressure, and subsequent ion transportation into high- vacuum region of mass spectrometer directly or via gas-dynamic interface comprised by number of stages with successively lower pressure. With relation to ion source, the entire mass spectrometer including mass analyzer, detector and all other parts, can be considered as a single ion detector which internal structure is not important for the purpose of this invention. Ions in non-vacuum or low vacuum region, particularly in region of atmospheric pressure, can be produced by units based on different techniques. Among these units are different spray devices and their options, including thermo- and electrospray devices, DESI, different devices with plasma ionization, including ionization in corona discharge, spark, creeping, surface, glow and other types of gas discharge, including discharge with inductively coupled plasma; different photo- and chemical ionization devices, including DARTS; different laser ionization devices. Corona discharge and different electrospray devices are most important for molecular mass spectrometry.

In all devices listed above ionization, ion transport from the place of ionization to the mass spectrometer entry and ion income itself form single continuous process performed under combined effect of gas jets in the source and electric, magnetic and electromagnetic fields applied. In case of spray devices, the situation is complicated by the fact of formation ion precursors in the form of charged droplets of different size instead of ions themselves. Droplet evaporation and ion coming out into the gas phase takes place simultaneously with transport of all charged particles to the mass spectrometer entry.

Effective ionization and ion collection are complicated by number of physical effects which limit both ionization and charged particle transport. First, external electric fields which control particle movement can not be arranged to guide particles directly to mass spectrometer entry as conservative electric field lines are to be locked at electrodes. This causes considerable spatial scattering of charged particles, both ions and drops, and reduces their ingress to mass spectrometer entry. Second, spatial charge caused by charged particles themselves increases particle spatial scattering and decrease the efficiency of plasma or spray ionization due to particle deceleration. This is especially significant for a high flowrate, e.g. when the mass spectrometer is combined on-line with a high-performance liquid chromatograph or similar device.

Known ion source for mass spectrometer (ref. application PCT WO2011075449, ΜΠΚ H01J49/06; H01J49/16, published 23.06.2011) comprises chamber, emitter capillary for electrospray, internal pass for liquid sample delivery, electrode blocks to apply first electric voltage placed immediately at emitter capillary, emitter tip or tips for desorption of charged particles made of liquid sample, counter electrode to apply second voltage different from the first one placed near and around ion outlet, and shield electrode placed between mentioned counter electrode and emitter tip or tips formed as a part of equipotential surface.

Known apparatus is deficient in means for spatial separation of droplets and ions, both generated at emitter tips and produced as a result of droplet evaporation. Consequently, relatively slow moving droplets create significant spatial charge causing a repulsion of charged particles and loss, most of all, in ions, which are essentially more mobile as compared with droplets. This in turn, results in considerable ion loss during transport and desolvation.

Known ion source for mass spectrometer (ref. application US2011309243, ΜΠΚ H01J49/10; H01J49/26 published 22.12.2011) comprises axis symmetric chamber with electrospay unit with emitter capillary inside installed transversely to the chamber axis; unit for corona discharge ionization at atmospheric pressure with needle installed transversely to the chamber axis opposite the emitter capillary, counterelectrode located near the chamber end with ion outlet at the chamber axis; compressed gas source and gas supply piping with outlets near the needle and emitter capillary located inside supply pipe near the pipe end.

The known ion source does not provide enough room for droplet evaporation and ion desolvation; this is true both for ions and charged droplets moving from emitter capillary or corona needle, as this movement is just between the capillary and the mass-spectrometer income orifice.

This results in production of significant spatial charge, ion repulsion and unstable operation of electrospray unit, particularly when the sample flowrate is high.

Known ion source for mass spectrometer (ref. patent US 6177669, ΜΠΚ GOlNl/00, published 23.01.2001), comprises cylinder chamber with ion outlet at one end; electrospray unit with emitter capillary located inside the chamber at its axis or angularly; unit for vortex gas flow making with heated compressed gas source and gas supply piping. Chamber end with ion outlet is also a counterelectrode for the electrospray unit.

Known apparatus is deficient in means for ion separation from charged droplets and for ion direction to the chamber ion outlet, thereof charged particles of both types move jointly along composite paths defined by a particle mobility, the gas flow and electric field. In known apparatus, charged particles and ions released from the droplets, are located in space between the spray capillary and ion outlet; and the vortex gas motion slows down axial ion motion. This leads to appearence of the significant spatial charge inside the chamber and significant ion loss due to ion repulsion and deposition at chamber walls. As the result, sample utilization factor is less than 0.1 per cent even at low flow rates. Moreover, spatial charge leads to unstable operation of the electrospray unit, especially at a large sample flow, e.g. when the mass spectrometer is combined with a high-performance liquid chromatograph.

Known ion source for mass spectrometer (ref. patent US6818888, ΜΠΚ G01N 27/62; H01J 49/04, published 16.11.2004), comprises axisymmetric chamber, sample feed unit connected to the chamber using communication facilities with outlet, ionization unit located behind the outlet to create charged particle stream and gas feed unit to direct gas flow into the chamber in such a way that there is tangential component of gas velocity regarding to chamber axis.

In known apparatus, tangentially infeeded gas makes stationary or quasi-stationary vortex moving charged droplets by gas flow. This significantly increases droplet residence time in gas flow and leads to increasing droplet evaporation efficiency and ion desolvation. At the same time, charged droplets and ions coming out from droplets, are located inside said chamber between ionization means (e.g. spray capillary) and ion outlet, and gas tangential moving decelerates axial moving of charged particles. This significantly increases the role of spatial charge hence the ions are pushed out of the transport unit by the field of spatial charge and are lost at the walls of the unit. As the result sample utilization factor is no greater than 0.1 per cent even at low flowrates. In known apparatus, electrospray operation is also seriously degraded due to spatial charge, especially at high sample feed, e.g. when the mass spectrometer is operating in combination with high-performance liquid chromatograph

Known ion source (ref. patent US7564029, ΜΠΚ H01J 49/26, published 21.07.2009) comprises chamber with ion outlet at one of limit surfaces, electrospray unit with emitter capillary located in the chamber, heated compressed gas source and gas supply piping with outlets close to the ion output unit made in form of at least one transport capillary for sample move, or set of sequential capillaries.

In known apparatus droplet evaporation under the action of heat air (ion desolvation) takes place inside a narrow transport capillary. As the result, produced ions diffuse to capillary walls and are lossed due to significantly high diffusion factor compared with one of droplets. This makes sample utilization factor sufficiently low, as ions are lossed at transport capillary walls at high gas temperature when they are evaporated efficiently, and they are not produced from charged droplets at a low gas temperature. This reduces the sensitivity and also leads to interface electrode contamination with sediments brought by droplets. Such contamination deteriorates operation of the unit.

Known ion source for mass spectrometer (ref. application US2009050801, ΜΠΚ B01D 59/44; F15C 1/18, published 26.02.2009) is concurrent with given invention for the largest number of essential features and is considered a prototype. Prototype ion source comprises conical axisymmetric chamber with axial orifice at the first end, sample electrospray unit is located inside the orifice, at least one pipe to feed compressed hot gas into the chamber is installed at the first chamber end tangentially to the side wall, central orifice for ion output is located at the second end of the chamber, annular orifice for gas exhaust is located near the side wall. The chamber is conical, converging to the second end. Radiofrequency focusing system with ring electrodes is located near chamber side wall.

In know prototype source vortex gas motion ensures effective desolvation and ion release from sample droplets. However, there is a significant sample droplets spatial charge in the chamber of the known prototype source, because vortex gas motion holds charged sample droplets in chamber region. Due to the spatial charge, most of ions are lossed at chamber walls, so a number of charged particles, ions most of all, delivered to the mass spectrometer entry, is reduced. As we know, radiofrequency focusing system with ring electrodes located near chamber side wall forces only ions, not droplets, and is not able to effectively withstand spatial charge defocusing effect.

This invention is aimed to provide ion source for mass spectrometer which would ensure increase in the number of charged particles, ions most of all, coming from the ion source to the entry of the mass spectrometer.

This aim is accomplished by a series of inventions joined by a unifying inventive idea. For the first variant, the aim is achieved by incorporating the chamber into ion source for mass spectrometer; there is an orifce with sample electrospray unit at the first end. At least one pipe to feed compressed hot gas into the chamber is installed in the chamber side wall at the first end tangentially to the side wall. At the second chamber end, there are two electrodes: the first electrode with a central orifice for ion output is surrounded by the second electrode with an orifice in its central area, both are forming an electrostatic ion focusing lens. There is at least one orifice in the side wall of the chamber for gas and non-evaporated droplets exhaust, located at the distance d of the second end satisfying the equation:

0,lD<d<10D, cm; (1)

where D is the diameter of the second end of the chamber, cm.

At least two pipes can be installed in the chamber side wall at the first end tangentially to the side wall, to feed compressed hot gas into the chamber.

First electrode can be in form of cylinder or conic frustum opened outwards of the chamber.

Second electrode in ion source can be in form of a flat disk; be a cone opened upwards to the first end of the chamber; be flat with folded edges, have a shape of a curved cone, which generatrix can have negative curvature directed inside the cone, or can have a shape of broken line.

The chamber can be cylindrical, conical or oval in cross-section, narrowing or widening towards the first end of the chamber.

Side wall orifice for gas and non-evaporated droplets exhaust can be in form of annular gap.

At least two orifices for gas and non-evaporated droplets exhaust can be made in a chamber side wall.

New features of the source are: making at least one orifice for outcoming of gas and non-evaporated droplets exhaust in the chamber side wall at the distance d from the second end of the chamber according to equation (1) set above, and placing the first electrode with central orifice for ion output surrounded by the second electrode with a orifice in central area, forming together with the first electrode electrostatic ion focusing lens.

These design features ensure effective droplets evaporation at their vortex move along with hot gas and release of ions which keep moving with gas. When gas and moving charged particles come near the second end, one or several orifices in the side wall ensure gas exhaust from the chamber; most part of space charge also leave the chamber as it is mostly due to non- evaporated droplets. By this moment sample ions come into the significant electric field created by first end second annular electrodes; ions are focused and directed by electric field lines to the chamber outlet. Ions with relatively high mobility move mostly along electric force lines produced by focusing electrodes; they come out from gas streamlines and move to the source outlet. Quite the contrary, non-evaporated droplets move along gas streamlines due to relatively low mobility, and leave the chamber with the gas.

If one or several orifices in chamber side wall are made at the distance d <0,1D, vortex gas streams will effectively come close to the second end. In this case, effect of ion and droplet spatial separation described above will not occur, and spatial charge created by droplets with oppose ion focusing, and ion directing to the central orifice of the first electrode will be not efficient.

If one or several orifices in chamber side wall are made at the distance d >10D, the electric field created by the first and the second electrodes will not reach a region of moving and rotating gas. A force to separate relatively mobile ions from droplets does not appear and array of charged particles will move along gas streamlines and along force lines of the filed created by their own spatial charge only. So only small portion of ions will come to the region where electric fields of the first and the second electrodes will direct them to the source outlet, and ion collection rate will be low.

For the second variant, the aim is achieved by incorporating a chamber into ion source for mass spectrometer and by installation at least one pipe tangentially to the side wall near the first end to feed hot compressed gas into the chamber and by making the orifice with sample electrospray unit in the side wall. The orifice for gas exhaust is located in central region of the first end. At the second chamber end there is first electrode with central orifice for ion output surrounded by the second electrode with an orifice in the central area, forming an electrostatic ion focusing lens together with the first electrode.

At least two pipes to feed compressed hot gas into the chamber are installed in the chamber side wall at the first end tangentially to the side wall.

First electrode can be in form of cylinder or conic frustum opened outwards of the chamber.

Second electrode in the ion source can be in from of a flat disk; a cone opened upwards to the first end of the chamber; it can be flat with folded edges, have a shape of a curved cone, which generatrix can have negative curvature directed inside the cone, or can have a shape of a broken line.

The chamber can be cylindrical, conical or oval in cross-section, narrowing or widening towards the first end of the chamber.

New features of the source are: orifice in the chamber side wall near the first end with sample electrospray unit inside, orifice in central region of the first end for gas and non- evaporated droplets exhaust, placing the first electrode with central orifice for ion output surrounded by the second electrode with an orifice in the central area, to produce an electrostatic ion focusing lens together with the first electrode.

These design features ensure effective droplets evaporation at their vortex move along with hot gas and release of ions which keep moving with gas. When gas comes to the second end of the chamber to-gather with charged particles that it carries, a so-called "submerged area" is produced just near the chamber end, and gas flows cannot go inside it. At this region, the gas starts to move backward mostly near the central area of the chamber. The orifice in the first end ensures gas exhaust to-gether with non-evaporated droplets producing most part of spatial charge. When gas vortex move slows near the border of the "submerged area", the liberated ions come into the significant electric field created by first and second annular electrodes; they are focused and directed by electric field lines to the chamber outlet. Ions with relatively high mobility move mostly along electric force lines produced by focusing electrodes; they come out from gas streamlines and move to the source outlet. Quite the contrary, non- evaporated droplets move along gas streamlines due to relatively low mobility, and leave the chamber with the gas.

This invention is illustrated by the Figures where:

In Fig. 1, a cross-section side view for the realization of the first variant of ion source for mass spectrometer is shown;

In Fig. 2, the top view for is ion source for mass spectrometer presented at Fig. 1 is shown; In Fig. 3, a cross-section side view for the other realization of the first variant of ion source for mass spectrometer is shown;

In Fig.4, the top view for is ion source for mass spectrometer presented in Fig. 3 is shown;

In Fig 5, a cross-section side view for the third realization of the first variant of ion source for mass spectrometer is shown; In Fig. 6, the top view for is ion source for mass spectrometer presented at Fig. 5 is shown; In Fig. 7, a cross-section side view for the realization of the second variant of ion source for mass spectrometer is shown;

In Fig. 8, the top view for is ion source for mass spectrometer presented at Fig. 7 is shown; In Fig. 9, a cross-section side view for the other realization of the second variant of ion source for mass spectrometer is shown;

An ion source for mass spectrometer according to one of realizations of first variant comprises (ref. Fig. 1 - Fig. 2) cylindrical chamber 1 with the orifice 3 in the first end 2 of the chamber 1, where sample electrospray unit 4 is located. The pipe 7 for compressed hot gas feed into the chamber 1 is placed tangentially to the side wall 5 inside the orifice 6 in the side wall 5 of the chamber 1 near the end 2. Air, nitrogen, sulfur hexafluoride and other gas without condensation at ambient temperature can be used as compressed hot gas. Gas is fed tangentially into the chamber 1, and is heated up to the temperature sufficient for desolvation of droplets 8. The first annular electrode 11 with central orifice 12 for ion output surrounded by a flat disk second electrode 13 with an orifice 14 in central area, is fixed using, e.g. insulating insert 15, and is installed at the second end 9 of the chamber 1 using, e.g. insulating insert 10. The second flat disk electrode together with the first annular electrode 11 forms electrostatic focusing lens for ions 16 produced due to evaporation of droplets 8. Annular orifice 17 is made in the side wall 5 of the chamber 1 for gas and non-evaporated droplets 8 exhaust; it is located at the distance d of the second chamber end satisfying the equation (1). Upper and lower parts of the chamber 1 are shackled to gether 18.

This ion source for mass spectrometer for other realization of the first variant comprises (ref. Fig. 3 - Fig. 4), conical chamber 19 converging to the second end 20 of the chamber 19. The orifice 3 with sample electrospray unit 4 is made axially in the first convex end 21 of the chamber 19. Four equidistant pipes 7 to feed compressed hot gas into the chamber 19 are installed tangentially to the side wall 22 in orifices 6 in side conical wall 22 of the chamber 19 near the first end 21. Gas is fed tangentially into the chamber 19, is heated up to the temperature sufficient for desolvation of droplets 8. The first annular electrode 11 with central conical orifice 12 for ion output is installed at the second end 20 of the chamber 19 using, e.g. insulating insert 10. The first annular electrode 11 is surrounded by the second conical electrode 23 with the orifice 24 in the central area. The second conical electrode 23 can be fixed in the chamber 19 using, e.g. annular insulating insert 25. The second conical electrode 23 with the orifice 24 in its central area together with the first annular electrode 11 forms electrostatic focusing lens for ions 16 produced of droplets 8. Four gap orifices 26 are made in the side wall 22 of the chamber 19 for gas and non-evaporated droplets 8 exhaust, located at the distance d of the second end satisfying the equation (1).

This ion source for mass spectrometer for one more realization of first variant comprises (ref. Fig. 5 - Fig. 6) cylindrical chamber 27 with the orifice 3 in the first end 28 of the chamber 27, where sample electrospray unit 4 is located. Two equidistant pipes 7 to feed compressed hot gas into the chamber 27 are installed tangentially to the side wall 29 in orifices 6 in side wall 29 of the chamber 27 near its first end 28. Gas is fed tangentially into the chamber 27, and is heated up to the temperature sufficient for desolvation of droplets 8. The first conical electrode 32 with central conical orifice 33 for ion output is installed at the second end 30 of the chamber

I using, e.g. insulating insert 31. The first conical electrode 32 is surrounded by the second conical electrode 34 with an orifice 35 in its central part. The second conical electrode 34 together with the first conical electrode 32 forms electrostatic focusing lens for ions 16 produced of droplets 8. Four gap orifices 37 are made in the side wall 29 of the chamber 27 for gas and non-evaporated droplets 8 exhaust, located at the distance d of the second end 30 satisfying the equation (1). Needles 39 for corona charge ignition concurrently with electrospray or independently can be installed in the side wall 29 of the chamber 27 near the first end 28 using insulating inserts 38.

This ion source for mass spectrometer for one of realizations of the second variant comprises (ref. Fig. 7 - Fig. 8) annular chamber 40 with the orifice 42 for gas exhaust made in the first end 41 of the chamber 40. The pipe 7 for compressed hot gas feed into the chamber 40 is placed tangentially to the side wall 43 inside the orifice 6 in the side wall 43 of the chamber 40 near the end 41. Air, nitrogen, sulfur hexafluoride and other gas without condensation at ambient temperature can be used as compressed hot gas. The orifice 44 with sample electrospray unit 4 is made in the side wall 43 of the chamber 40 near the first end 41. Gas fed tangentially into the chamber 40, is heated up to the temperature sufficient for desolvation of droplets 8. The first annular electrode 11 with central orifice 12 for ion output surrounded by flat disk second electrode 46 with a orifice 47 in central area and folded periphery 48, fixed using, e.g. insulating insert 49, is installed at the second end 45 of the chamber 40 using, e.g. insulating insert 10. The second flat disk electrode 46 together with the first annular electrode

II forms electrostatic focusing lens for ions 16 produced of droplets 8. This ion source for mass spectrometer for other realization of the second variant comprises (ref. Fig. 9 - Fig. 10) conical chamber 50 convergent to the second end 51 of the chamber 50. The orifice 53 for gas and non-evaporated droplets 8 exhaust is made in the first convex end 52 of the chamber 50. Four equidistant pipes 7 to feed compressed hot gas into the chamber 50 are installed tangentially to the side wall 54 in orifices 6 in side conical wall 54 of the chamber 50 near the first end 52. The orifice 55 with sample electrospray unit 4 is made in the side conical wall 54 of the chamber 50. Gas fed tangentially into the chamber 50, is heated up to the temperature sufficient for desolvation of droplets 8. The first annular electrode 11 with central conical orifice 12 for ion output is installed at the second end 51 of the chamber 50 using, e.g. insulating insert 10. The first annular electrode 11 is surrounded by the second conical electrode 56 with the orifice 57 in central area. The second conical electrode 56 can be fixed in the chamber 50 using, e.g. annular insulating insert 58. The second conical electrode 56 with the orifice 57 in central area together with the first annular electrode 11 forms electrostatic focusing lens for ions 16 produced of droplets 8.

This ion source as per first variant for mass spectrometer works as follows (by the example of the apparatus shown at Fig. 1-Fig. 2). Supplied to the electrospray unit 4 liquid sample is dispersed and in form of charged droplets 8 comes into the chamber 1. Hot gas comes into the chamber 1 through pipes 7 in orifices 6 tangentially to the wall 5 and makes a vortex filling entire internal space of the chamber 1 or, at least, central area of the chamber. Charged droplets 8 captured by gas streamlines move with them. At that droplets evaporate and reduce their size, ions come out and desolvate. When coming to the second end 17 the gas includes mix of different charged particles: non-evaporated charged droplets 8, micro- and nanodroplets produced from initial droplets 8 as the result of sequential evaporation and decomposition, free ions. On approaching the second end 9 of the chamber 1, i.e. to the line of orifices 17, by distance about d, the charged particles become affected by the electric field created by an electrostatic lens consisting of the first 11 and second 13 electrodes, placed in the end of the chamber 1.

Under this field charged particles obtain velocity component directed to the central orifice 12 intended for ion output. Ions 16 with relatively high mobility will be effectively extracted by the field from gas stream and will come to the area between orifices 17 and electrodes 11 and 13 where, from gas dynamic position, "submerge mode" is implemented and fast gas streams are absent, because at d>0.1D penetration of these streams into the region near chamber end is low. At the same time droplets 8 as well as micro- and nanodroplets with relatively low mobility will mostly move along gas streamlines will minimally come into the area between orifices 17 and electrodes 11 and 13 and will be exhausted out of the chamber 1 through the orifices 17. As the result, the spatial charge in the area between orifices 17 and electrodes will be significantly below the charge in that part of the chamber 1 where vortex gas motion is present, because slowly moving droplets carrying significant charge practically do not come into that area. This will allow electrostatic lens formed by electrodes 11 and 13 effectively focus ions and direct them to the area immediately adjacent to the orifice 12 for ion output. Hot or cold gas can be supplied also from the second end 9 towards droplets 8 (this gas entry is not shown at the drawing). This gas can be supplied both as direct stream and as vortex or helix or helices. Such gas supply can improve droplet desolvation and prevent mass spectrometer from droplet ingress.

This ion source as per first variant for mass spectrometer works as follows (by the example of the apparatus shown in Fig. 9— Fig. 10). Supplied to the electrospray unit 4 liquid sample is dispersed and in form of charged droplets 8 comes into the chamber 50. Hot gas comes into the chamber 50 through pipes 7 in orifices 6 tangentially to the wall 54 and makes a vortex filling entire internal space of the chamber 50 or, at least, central area of the chamber. Charged droplets 8 are captured by gas streamlines, move with them, are evaporated gradually, and decrease in size, ions to release and be desolvated. When coming to the second end 51 the gas includes mix of different charged particles: non-evaporated charged droplets 8, micro- and nanodroplets produced from initial droplets 8 as the result of sequential evaporation and decomposition, free ions. When gas and charged particles that it carries come to the second end 51 so-called "submerged area" weakly permeated by gas flows is created in immediate proximity to the end. At this the gas starts to move backward collecting near the central area of the chamber 50 and goes away through the orifice 53 in the first end 52 taking away most of non-evaporated droplets spatial charge. By this moment, when gas vortex move slows when coming to the "submerged area" sample ions 16 has come into significant electric field created by first end second annular electrodes 11, 56, and then are focused and directed by electric field lines to the central orifice 12 intended for ion output. At the same time droplets 8 as well as micro- and nanodroplets with relatively low mobility will mostly move along gas streamlines and will be exhausted out of the chamber50 through the orifice 53. This will allow electrostatic lens formed by electrodes 11 and 56 effectively focus ions and direct them to the area immediately adjacent to the orifice 12 for ion output. Hot or cold gas can be supplied also from the second end 51 towards droplets 8 (this gas entry is not shown at the drawing). Such gas supply can improve droplet desolvation and prevent mass spectrometer from droplet ingress. As per this invention the chamber can be axisymmetric or non-axisymmetric. Chamber ends can be in form of any convex figure (circle, ellipse, triangle, complex figure). Ends can be different in shape and size.

Additional chemicals can be supplied into the chamber through the pipes to ensure recharge and/or chemical ionization modes. This allows obtaining ions of analyt (or analylts) not included in sprayed initial sample substance.

Additional ionization sources, e.g. needles for corona charge, capillaries for additional electrospray, flame sources etc, and be installed in the chamber.

Radiofrequency focusing system in form of a system of flat, concentric, rod or other form electrodes making radiofrequency multipole (tripole, quadrupole, ...) or other known system for radiofrequency focusing of charged particles can be installed at the wall of the chamber or outside of the chamber (in this case the chamber is to be made of dielectric or low conductive material). This system improves ion transport to the entry area of mass spectrometer and reduce ion loss probability at chamber walls ensuring ion repulsion due to pseudopotential effect.

It is possible to use constant, slowly varying or modulated magnetic field directed to the detector of the mass spectrometer. Magnetic field, in particular, can be configured with force lines divergent in area of sonic and supersonic gas motion where their impact to ion is minimal. This will allow to separate ions and droplets due to ion capture by magnetic lines and providing parallel ion motion while droplets are vortexed with gas.

Additional measures can be taken for heating and desolvation of droplets moving to the entry of the mass spectrometer by, e.g. additional chemicals supply, ultraviolet, visible, infrared, microwave or radiofrequency irradiation, ultrasonic acoustic waves exposure or by using any combination of desolvation agents mentioned above.

In addition to mentioned first and second electrodes additional electrodes for better ion focusing and directing to ion output can be installed inside the chamber or near its second end. These electrodes can be installed using insulating inserts, at insulating chamber walls or fixed as electrode assembly. This invention ensures spatial separation of ions and charged droplets, which gradually evaporation lets ions to come out. This separation reduces spatial charge and, therefore, increases droplets confinement time preventing droplets from spatial scattering due to repulsion. In our case this problem is solved by combination of high efficient vortex ion desolvation system and electrostatic lens which extracts significantly more mobile ions and directs them to mass spectrometer entry.