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Patent Searching and Data


Title:
LEARNING PROCESS DEVICE AND INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/054376
Kind Code:
A1
Abstract:
Provided is a learning processing device (30) which is based on a neural network model and image data obtained by capturing an image of the object to be inspected, and constructs the neural network model used for inspecting the object to be inspected, the learning processing device (30) being provided with a learning unit (30) which performs a learning process under a prescribed learning condition on the basis of a list of the image data including a plurality of learning images and constructs the neutral network model, wherein the learning unit (30) embeds unique model identification data in the neural network model, whenever the neural network model is constructed.

Inventors:
WADA KEN (JP)
Application Number:
PCT/JP2020/035141
Publication Date:
March 25, 2021
Filing Date:
September 16, 2020
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Assignee:
SYNTEGON TECH K K (JP)
International Classes:
G01N21/88; G01N21/90; G06T7/00
Foreign References:
JP2018198053A2018-12-13
JP2019061578A2019-04-18
Attorney, Agent or Firm:
YKI Intellectual Property Attorneys (JP)
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