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Patent Searching and Data


Title:
MANUFACTURED ARTICLE IMAGE INSPECTION DEVICE AND MANUFACTURED ARTICLE IMAGE INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2014/087946
Kind Code:
A1
Abstract:
When an inspection parameter is set or modified, a tuning control unit (30) of the manufactured article image inspection device (200) uses the set or modified inspection parameter value to perform the process of an image inspection process unit (23) and a defect determination unit (24) on captured images acquired of each of manufactured articles (1) under inspection; and stores the defect determination results obtained through this process for each of the manufactured articles (1), in a data storage unit (44), as well as comparing the stored determination results to expected determination data established beforehand, and displaying statistical data for the compared results on a display device (52).

Inventors:
FUKUDA HIROHISA (JP)
TSUTSUMI TAKAYUKI (JP)
KATANE TADAHIRO (JP)
OHNUKI MASARU (JP)
OHMORI SHUJI (JP)
Application Number:
PCT/JP2013/082274
Publication Date:
June 12, 2014
Filing Date:
November 29, 2013
Export Citation:
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Assignee:
HITACHI INF & CONTROL SYST (JP)
International Classes:
G01N21/88; G01N21/90; G06T1/00
Foreign References:
JP2002008013A2002-01-11
JP2001085482A2001-03-30
JPH09189528A1997-07-22
JP2005017159A2005-01-20
Attorney, Agent or Firm:
ISONO Michizo (JP)
Michizo Isono (JP)
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