Title:
MEMORY LINK FAULT DETECTION METHOD AND APPARATUS, AND RELATED DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/030371
Kind Code:
A1
Abstract:
Provided in the present application are a memory link fault detection method and apparatus, and a related device. The method can comprise the following steps: a processor performing fault error correction according to memory read-write exception information, so as to generate error correction information, wherein the error correction information comprises fault address information of a first memory particle to which a read-write exception occurs; and the processor determining a fault type according to the error correction information and historical error correction information, wherein the fault type comprises a non-memory link fault and a memory link fault, and the historical error correction information comprises fault address information of a second memory particle to which a historical read-write exception occurs. Therefore, multiple instances of fault detection are avoided, thereby reducing the error correction cost, and improving the error correction efficiency.
Inventors:
BAO QUANYANG (CN)
DONG WEI (CN)
ZHANG WENGUI (CN)
DONG WEI (CN)
ZHANG WENGUI (CN)
Application Number:
PCT/CN2022/116106
Publication Date:
March 09, 2023
Filing Date:
August 31, 2022
Export Citation:
Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G11C29/56
Attorney, Agent or Firm:
SCIHEAD IP LAW FIRM (CN)
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