METHOD FOR ANALYZING STATE OF CELLS IN SPHEROID

Title:

METHOD FOR ANALYZING STATE OF CELLS IN SPHEROID

Document Type and Number:

WIPO Patent Application WO/2017/216930

Kind Code:

A1

Abstract:

The present invention provides a method and an apparatus both for analyzing the state of cells, particularly the death of cells, in a spheroid in a non-invasive and quantitative manner during the culture of the spheroid. More specifically, the present invention provides a method and an apparatus both for analyzing the state of cells by carrying out the optical imaging of the spheroid using an optical device characterized by having high resolution performance to analyze the internal structure of the spheroid.

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Inventors:

SENDA NAOKO (JP)
SAKURAI TOSHINARI (JP)

Application Number:

PCT/JP2016/067970

Publication Date:

December 21, 2017

Filing Date:

June 16, 2016

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

C12Q1/02; C12M1/34; G01N21/27

Domestic Patent References:

WO2016009789A1	2016-01-21
WO2015145872A1	2015-10-01
WO2014021175A1	2014-02-06

Foreign References:

JP2012202761A	2012-10-22
JP2015181348A	2015-10-22
JP2012061337A	2012-03-29
JP2008220779A	2008-09-25

Other References: