Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD AND APPARATUS FOR INTER-BAND DL/UL BEAM CORRESPONDENCE TESTING
Document Type and Number:
WIPO Patent Application WO/2020/206472
Kind Code:
A3
Abstract:
Embodiment methods are provided to test whether a UE supports inter-band beam correspondence between two different frequency bands. In one embodiment, a tester transmits reference signals (RSs) to a UE in a first frequency band, and receives signals from the UE over a plurality of UE transmit beams in a second frequency band different than the first frequency band. The tester selects a beam from the plurality of UE transmit beams that corresponds to effective isotropic radiation power satisfying a predefined criterion, and determines that the UE supports inter-band beam correspondence between the first frequency band and the second frequency band, upon the selected beam satisfying a minimum peak EIRP requirement and a spherical coverage requirement in the second frequency band.

Inventors:
CHENG QIAN (US)
CHEN XIANG (US)
Application Number:
PCT/US2020/044348
Publication Date:
February 04, 2021
Filing Date:
July 30, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FUTUREWEI TECHNOLOGIES INC (US)
International Classes:
H04B7/06; H04B7/08; H04B17/12
Other References:
SAMSUNG: "Considerations on FR2 beam correspondence tolerance", vol. RAN WG5, no. Ljubljana, Slovenia; 20190826 - 20190830, 16 August 2019 (2019-08-16), XP051774242, Retrieved from the Internet [retrieved on 20190816]
INTEL CORPORATION: "On beam Correspondence test procedure", vol. RAN WG4, no. Athens, Greece; 20190225 - 20190301, 15 February 2019 (2019-02-15), XP051604968, Retrieved from the Internet [retrieved on 20190215]
LG ELECTRONICS: "Initial discussion on test procedure for beam correspondence in FR2", vol. RAN WG4, no. Athens, Greece; 20190225 - 20190301, 15 February 2019 (2019-02-15), XP051605439, Retrieved from the Internet [retrieved on 20190215]
Attorney, Agent or Firm:
ZOU, Hong et al. (US)
Download PDF: