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Title:
METHOD FOR BUILDING ABNORMALITY DIAGNOSIS MODEL, ABNORMALITY DIAGNOSIS METHOD, DEVICE FOR BUILDING ABNORMALITY DIAGNOSIS MODEL, AND ABNORMALITY DIAGNOSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/085350
Kind Code:
A1
Abstract:
A method for building an abnormality diagnosis model for a process in which a metal material is processed sequentially in a plurality of facilities, the method including: a first model creation step for creating a first abnormality diagnosis model in which the relationship between an abnormality and measured values for the same time is learned using measurement values measured for the plurality of facilities at the same time in a pre-set measurement cycle; and a second model creation step for creating a second abnormality diagnosis model in which the relationship between an abnormality and measured values for the same position is learned using measured values for each instance of the same position of the metal material obtained by editing, for each position of the metal material, measured values measured at the plurality of facilities.

Inventors:
MATSUSHITA MASAFUMI (JP)
HIRATA TAKEHIDE (JP)
Application Number:
PCT/JP2021/034601
Publication Date:
April 28, 2022
Filing Date:
September 21, 2021
Export Citation:
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Assignee:
JFE STEEL CORP (JP)
International Classes:
G01M99/00; B21B38/00; G05B19/418
Domestic Patent References:
WO2018096682A12018-05-31
Foreign References:
JPH10122917A1998-05-15
JP2019074969A2019-05-16
JP2011258113A2011-12-22
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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