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Title:
METHOD AND DEVICE FOR CONTINUOUS NON-DESTRUCTIVE INSPECTION OF MEMBRANE-ELECTRODE ASSEMBLY
Document Type and Number:
WIPO Patent Application WO/2017/183493
Kind Code:
A1
Abstract:
Provided are an inspection device and a method for continuous non-destructive inspection for rapidly inspecting the entire range of a membrane-electrode assembly (MEA) and detecting minute internal foreign matter and minute internal defects. This method for continuous non-destructive inspection of a membrane-electrode assembly has a step for detecting the presence of internal foreign matter and an internal defect in a membrane-electrode assembly using transmitted-X-ray images obtained by repeating a step for conveying a membrane-electrode assembly to an imaging position interposed between an X-ray imaging unit and an X-ray source having a focal dimension of 50 µm or less disposed facing the X-ray imaging unit, a step for temporarily stopping conveyance of the membrane-electrode assembly and capturing a transmitted-X-ray image by radiating X-rays from the X-ray source toward the X-ray imaging unit in a state in which the membrane-electrode assembly is stationary at the imaging position, and a step for resuming conveyance of the membrane-electrode assembly and moving the membrane-electrode assembly from the imaging position.

Inventors:
FUKUDA SEIJI (JP)
Application Number:
PCT/JP2017/014605
Publication Date:
October 26, 2017
Filing Date:
April 10, 2017
Export Citation:
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Assignee:
TORAY INDUSTRIES (JP)
International Classes:
G01N23/04; G01N23/083; G01N23/18
Foreign References:
JP2007265970A2007-10-11
JP2002071587A2002-03-08
JP2000039404A2000-02-08
Other References:
See also references of EP 3447479A4
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