Title:
METHOD AND DEVICE FOR MEASURING MICROCRYSTAL GRAIN ORIENTATION DISTRIBUTION
Document Type and Number:
WIPO Patent Application WO/2007/052688
Kind Code:
A1
Abstract:
A method for measuring orientation distribution in which the orientation distribution of microcrystal grains continuously supplied from a manufacturing process can be examined inline or online and a device therefore are provided. An X-ray beam is monochromatized and directed to the surface of a measurement sample (microcrystal grains in a YBCO film (layer))(S) grown on a metal tape (MT) with a predetermined angular width centering the Bragg angle. The diffraction image of the applied X-rays is integrated with a two-dimensional X-ray detector (200) located in its diffraction direction to obtain a pole figure. With the spread in at least one direction ( Δ ω direction) as an index out of the spreads in two directions in the obtained pole figure, an orientation distribution measurement of the sample microcrystal grains which are continuously transferred is carried out inline or online.
Inventors:
KIKUCHI TETSUO (JP)
Application Number:
PCT/JP2006/321829
Publication Date:
May 10, 2007
Filing Date:
November 01, 2006
Export Citation:
Assignee:
RIGAKU DENKI CO LTD (JP)
KIKUCHI TETSUO (JP)
KIKUCHI TETSUO (JP)
International Classes:
G01N23/20; H01B13/00
Foreign References:
| JP2003300726A | 2003-10-21 | |||
| JPH05296945A | 1993-11-12 | |||
| JPS6110749A | 1986-01-18 |
Attorney, Agent or Firm:
NITTO INTERNATIONAL PATENT OFFICE P.P.C (3-3 Shinkawa 1-chom, Chuo-ku Tokyo 33, JP)
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