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Patent Searching and Data


Title:
METHOD FOR DIAGNOSING LANGUAGE PROFICIENCY USING BRAIN WAVE MEASUREMENT TECHNOLOGY
Document Type and Number:
WIPO Patent Application WO/2021/107362
Kind Code:
A1
Abstract:
A method for diagnosing language proficiency using brain wave measurement technology according to an embodiment of the present invention comprises the steps of: generating a stimulus list classified on the basis of the length of a root word and the frequency of a word, and including a plurality of stimulus elements; providing the plurality of stimulus elements included in the stimulus list to a user, checking a response of the user after a preset time, and measuring a first brain wave corresponding to the response of the user; and comparing waveforms between the first brain wave and a second brain wave of a native speaker, and evaluating language proficiency of the user according to a result of comparing the waveforms of the first brain wave and the second brain wave.

Inventors:
NAM KI CHUN (KR)
JUNG JAE BUM (KR)
KIM JOON WOO (KR)
LEE SOL BIN (KR)
Application Number:
PCT/KR2020/012761
Publication Date:
June 03, 2021
Filing Date:
September 22, 2020
Export Citation:
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Assignee:
UNIV KOREA RES & BUS FOUND (KR)
International Classes:
G09B5/02; G09B19/06
Foreign References:
KR101796743B12017-11-10
KR20180111002A2018-10-11
KR20180084700A2018-07-25
KR20180100780A2018-09-12
US20070100251A12007-05-03
Attorney, Agent or Firm:
LEE, Ki Sung (KR)
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