Title:
METHOD FOR EVALUATING THE QUALITY OF A COMPUTER PROGRAM
Document Type and Number:
WIPO Patent Application WO2006012867
Kind Code:
A3
Abstract:
The invention relates to a method for evaluating the quality of a computer program that, during execution, the input data and the output data of an integrated circuit are influenced. The method comprises the following steps: (a) preparing a mutated integrated circuit which is obtained by incorporating one or more functional mutations into the (unmutated) integrated circuit; (b) influencing the input data and the output data of the mutated integrated circuit during which the output data of the mutated integrated circuit are recorded; (c) comparing the hereby obtained output data obtained of the mutated integrated circuit with the output data that are expected when influencing the unmutated integrated circuit by the computer program, and; (d) evaluating the quality of the computer program on basis of the comparison results.
Inventors:
GROSSE JOERG (DE)
HAMPTON MARK (FR)
HAMPTON MARK (FR)
Application Number:
PCT/DE2005/001340
Publication Date:
May 26, 2006
Filing Date:
July 28, 2005
Export Citation:
Assignee:
CERTES S A (FR)
GROSSE JOERG (DE)
HAMPTON MARK (FR)
GROSSE JOERG (DE)
HAMPTON MARK (FR)
International Classes:
G06F17/50
Foreign References:
| DE19959157A1 | 2000-08-03 | |||
| US6473726B1 | 2002-10-29 |
Other References:
JEFFERSON OFFUTT A: "INVESTIGATIONS OF THE SOFTWARE TESTING COUPLING EFFECT", ACM TRANSACTIONS ON SOFTWARE ENGINEERING AND METHODOLOGY, ASSOCIATION FOR COMPUTING MACHINERY, NEW YORK, US, vol. 1, no. 1, January 1992 (1992-01-01), pages 5 - 20, XP000365048, ISSN: 1049-331X
KING K N ET AL: "A FORTRAN LANGUAGE SYSTEM FOR MUTATIONBASED SOFTWARE TESTING*", SOFTWARE PRACTICE & EXPERIENCE, WILEY & SONS, BOGNOR REGIS, GB, vol. 21, no. 7, 1 July 1991 (1991-07-01), pages 685 - 718, XP000297324, ISSN: 0038-0644
VADO P ET AL: "A methodology for validating digital circuits with mutation testing", CIRCUITS AND SYSTEMS, 2000. PROCEEDINGS. ISCAS 2000 GENEVA. THE 2000 IEEE INTERNATIONAL SYMPOSIUM ON MAY 28-31, 2000, PISCATAWAY, NJ, USA,IEEE, vol. 1, May 2000 (2000-05-01), pages I343 - I346, XP010503205, ISBN: 0-7803-5482-6
KING K N ET AL: "A FORTRAN LANGUAGE SYSTEM FOR MUTATIONBASED SOFTWARE TESTING*", SOFTWARE PRACTICE & EXPERIENCE, WILEY & SONS, BOGNOR REGIS, GB, vol. 21, no. 7, 1 July 1991 (1991-07-01), pages 685 - 718, XP000297324, ISSN: 0038-0644
VADO P ET AL: "A methodology for validating digital circuits with mutation testing", CIRCUITS AND SYSTEMS, 2000. PROCEEDINGS. ISCAS 2000 GENEVA. THE 2000 IEEE INTERNATIONAL SYMPOSIUM ON MAY 28-31, 2000, PISCATAWAY, NJ, USA,IEEE, vol. 1, May 2000 (2000-05-01), pages I343 - I346, XP010503205, ISBN: 0-7803-5482-6
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