Title:
METHOD OF INSPECTING CLEANLINESS OF TOP AND DEVICE USED THEREFOR
Document Type and Number:
WIPO Patent Application WO/1991/019035
Kind Code:
A1
Abstract:
A method of inspecting cleanliness of a top in which pill defects and plant defects are classified from image signals obtained through imaging the top with an image sensor by adopting suitably the methods of discrimination, such as roundness discrimination, slenderness discrimination, gradation discrimination, dispersion discrimination, area discrimination, shape discrimination, gradation ratio discrimination, length measuring discrimination. A device for inspecting the cleanliness of the top in which a sliver is imaged with an image sensor while being expanded uniformly and fed and the obtained image signals are processed with an image processing device.
Inventors:
NISHI NORIYUKI (JP)
MUTO TADASHI (JP)
TAKAYAMA SHINICHI (JP)
MUTO TADASHI (JP)
TAKAYAMA SHINICHI (JP)
Application Number:
PCT/JP1991/000709
Publication Date:
December 12, 1991
Filing Date:
May 28, 1991
Export Citation:
Assignee:
KANEBO LTD (JP)
International Classes:
D06H3/08; D01G31/00; G01N21/89; G01N21/892; G01N21/898; G01N33/36; G06T7/00; G01N15/14; G01N21/94; (IPC1-7): D06H3/08; G01N21/89
Foreign References:
JPH01143943A | 1989-06-06 | |||
JPH06293637A | 1994-10-21 | |||
JPS63273014A | 1988-11-10 |
Other References:
See also references of EP 0491954A1
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