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Patent Searching and Data


Title:
METHOD FOR MEASURING ELECTROMAGNETIC SIGNAL RADIATED FROM DEVICE AND ELECTRONIC DEVICE THEREOF
Document Type and Number:
WIPO Patent Application WO/2020/101402
Kind Code:
A1
Abstract:
A method for measuring an electromagnetic (EM) signal radiated from an external electronic device and an electronic device thereof are provided. The electronic device includes a housing, a display, a first conducting unit, a second conducting unit, at least one EM sensing circuit, at least one wireless communication circuit, a processor, and a memory. The memory stores instructions of when being executed, enabling the processor to receive, by using the first conducting unit, a first signal sensed by the EM sensing circuit, and receive, by using the second conducting unit, a second signal sensed by the EM sensing circuit, and provide a signal pattern on the basis of the first signal and the second signal, and identify an external electronic device, at least partially on the basis of the signal pattern.

Inventors:
LEE YOUNGBAE (KR)
LEE SEUNGWOO (KR)
KIM SEUNGNYUN (KR)
Application Number:
KR2019/015576
Publication Date:
May 22, 2020
Filing Date:
November 14, 2019
Export Citation:
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Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G01R29/08
Foreign References:
US20140256375A12014-09-11
KR20150106535A2015-09-22
KR20180031424A2018-03-28
JP2000065876A2000-03-03
KR20160000330A2016-01-04
Attorney, Agent or Firm:
KWON, Hyuk-Rok et al. (KR)
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