Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
METHOD FOR MEASURING VARNISH FILM THICKNESS OF PRINTED ARTICLE AND VARNISH FILM THICKNESS MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/056029
Kind Code:
A1
Abstract:
The present invention is a method for measuring the varnish film thickness of a printed article by obtaining the film thickness of varnish on a sheet (1) on which a pattern is printed on a base thereof with ink and the pattern is coated with the varnish, wherein a metal foil (1c) having a smooth surface is attached to the base of the sheet (1), and the film thickness of the varnish coated directly over the metal foil (1c) is detected with a spectral interference-type film thickness meter (81) so as to determine whether the film thickness of the varnish is acceptable or not on the basis of the results detected by the spectral interference-type film thickness meter (81).

Inventors:
NUMAUCHI HIROMITSU (JP)
Application Number:
PCT/JP2017/031708
Publication Date:
March 29, 2018
Filing Date:
September 04, 2017
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
KOMORI CORP (JP)
International Classes:
B41F33/00; B41M3/14; B41M7/02
Domestic Patent References:
WO2002094577A12002-11-28
Foreign References:
JP2009613A
JP2007118219A2007-05-17
JP2003211896A2003-07-30
JP2015513485A2015-05-14
JP2014210438A2014-11-13
Other References:
See also references of EP 3517299A4
Attorney, Agent or Firm:
MITSUISHI, Toshiro et al. (JP)
Download PDF: