METHOD AND SYSTEM FOR SMART FACTORY LAYOUT EFFICIENCY EVALUATION

Title:

METHOD AND SYSTEM FOR SMART FACTORY LAYOUT EFFICIENCY EVALUATION

Document Type and Number:

WIPO Patent Application WO/2019/112380

Kind Code:

A1

Abstract:

Provided is a method and system for smart factory layout efficiency evaluation. A method for smart factory layout efficiency evaluation according to an embodiment of the present invention comprises: evaluating candidate layouts of a smart factory in a first scheme so as to select some candidate layouts as excellent candidate layouts; and evaluating the excellent candidate layouts in a second scheme so as to select, as a final layout, one of the excellent candidate layouts. Accordingly, the present invention enables automatic evaluation of efficiency of a smart factory layout through various systematic indicators other than the subjectivity of a person, and thus enables the objectivity of evaluation to be guaranteed.

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Inventors:

BAN JAE MAN (KR)
LIM JUNG WOO (KR)
KIM DU MAN (KR)
LEE YOUNG HOON (KR)
PARK SEONG HYEON (KR)
KIM YE EUN (KR)
BAE CHAN WOO (KR)

Application Number:

PCT/KR2018/015548

Publication Date:

June 13, 2019

Filing Date:

December 07, 2018

Export Citation:

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Assignee:

SK HOLDINGS CO LTD (KR)
UNIV YONSEI IACF (KR)

International Classes:

G06Q10/06; G06Q10/08

Foreign References:

JP2010122866A	2010-06-03
JP2000039905A	2000-02-08
JPH1185852A	1999-03-30
JPH07160739A	1995-06-23
JPH08229779A	1996-09-10

Attorney, Agent or Firm:

HAN, Gee Na (KR)

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