Title:
METHOD FOR TESTING CONTROL CHIP AND RELATED DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/179603
Kind Code:
A1
Abstract:
A method and apparatus for testing a control chip, and an electronic device and a computer-readable storage medium. The method comprises: reading a first test vector stored in a first target memory chip (S210); sending the first test vector to a control chip (S220); receiving first output information returned by the control chip in response to the first test vector (S230); and obtaining a first test result of the control chip according to the first output information and the corresponding first test vector (S240). A memory chip can be used to store a test vector for a control chip, thereby expanding the storage space of the test vector, thus improving test efficiency.
Inventors:
SHI CHUANQI (CN)
CHANG HENG-CHIA (CN)
DING LI (CN)
LIU JIE (CN)
HE JUN (CN)
YING ZHAN (CN)
CHANG HENG-CHIA (CN)
DING LI (CN)
LIU JIE (CN)
HE JUN (CN)
YING ZHAN (CN)
Application Number:
PCT/CN2020/121299
Publication Date:
September 16, 2021
Filing Date:
October 15, 2020
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/56; G11C29/12
Foreign References:
| CN110120242A | 2019-08-13 | |||
| CN103187092A | 2013-07-03 | |||
| CN101587754A | 2009-11-25 | |||
| CN102183726A | 2011-09-14 | |||
| CN104505126A | 2015-04-08 | |||
| CN106205738A | 2016-12-07 | |||
| CN110289041A | 2019-09-27 | |||
| CN1627516A | 2005-06-15 | |||
| CN207541950U | 2018-06-26 | |||
| US10114693B2 | 2018-10-30 | |||
| US20190051370A1 | 2019-02-14 | |||
| JPH1040700A | 1998-02-13 | |||
| CN202010167247A | 2020-03-11 |
Other References:
See also references of EP 4120276A4
Attorney, Agent or Firm:
BEIJING INTELLEGAL INTELLECTUAL PROPERTY AGENT LTD. (CN)
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