Title:
METHOD OF TESTING MEMORY DEVICE EMPLOYING LIMITED NUMBER OF TEST PINS AND MEMORY DEVICE UTILIZING SAME
Document Type and Number:
WIPO Patent Application WO/2021/072695
Kind Code:
A1
Abstract:
A method is used to test a memory device including a package substrate, a controller die (10) and a memory die (121). The package substrate includes an isolation pin, a test mode select pin, a test clock pin and a test data pin. The method includes setting the isolation pin to an isolation state to isolate the memory die (121) from the controller die (10), and when the isolation pin is set to the isolation state, setting the memory die (121) to receive control via the test mode select pin, the test clock pin and the test data pin.
Inventors:
XU XIAODONG (CN)
ZHAO XIANGMING (CN)
LIU SHUNLIN (CN)
CHEN YI (CN)
ZHAO XIANGMING (CN)
LIU SHUNLIN (CN)
CHEN YI (CN)
Application Number:
PCT/CN2019/111614
Publication Date:
April 22, 2021
Filing Date:
October 17, 2019
Export Citation:
Assignee:
YANGTZE MEMORY TECH CO LTD (CN)
International Classes:
G11C29/56
Foreign References:
| CN105679372A | 2016-06-15 | |||
| CN102956273A | 2013-03-06 | |||
| CN105825895A | 2016-08-03 | |||
| JP2002162444A | 2002-06-07 | |||
| CN101458971A | 2009-06-17 |
Attorney, Agent or Firm:
NTD UNIVATION INTELLECTUAL PROPERTY AGENCY LTD. (CN)
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