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Patent Searching and Data


Title:
MONITORING DEVICE AND MONITORING METHOD
Document Type and Number:
WIPO Patent Application WO/2020/179382
Kind Code:
A1
Abstract:
A monitoring device (100) that monitors the state of a monitoring target (MT) having a reflective material (MK) and comprises: an image acquisition unit (10) that obtains image data pertaining to a range image generated by a laser radar (200); and an analysis unit (30) that detects a pattern in the reflective material (MK) of the monitoring target (MT) shown inside the range image and specifies the position and posture of the monitoring target (MT), on the basis of the detected reflective material (MK) pattern and reference patterns for the reflective material (MK) stored beforehand in a database (Dm).

Inventors:
MURAMATSU TOSHIYUKI
Application Number:
PCT/JP2020/005270
Publication Date:
September 10, 2020
Filing Date:
February 12, 2020
Export Citation:
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Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01B11/00; G01S17/42
Domestic Patent References:
WO2018230517A12018-12-20
Foreign References:
JP2004233173A2004-08-19
JP2007122507A2007-05-17
Attorney, Agent or Firm:
WASHIDA & ASSOCIATES (JP)
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