Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
OPERATING CONDITION MEASURING SYSTEM AND OPERATING CONDITION MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2019/239564
Kind Code:
A1
Abstract:
Provided is an operating condition measuring system comprising a data processing device that processes data acquired from a sensor for measuring a target device, an analysis device that analyzes the data processed by the data processing device and distinguishes operating conditions of the target device, and a communication means that connects the data processing device with the analysis device by communication including wireless communication. In the operating condition measuring system, the data processing device converts the data acquired from the sensor into frequency division data divided for each frequency of the data and transmits the frequency division data via the communication means to the analysis device, and, on the basis of the received frequency division data, the analysis device determines the operation condition of the target device, decides the frequency of the frequency division data of the target device, and notifies the data processing device of the frequency.

Inventors:
TSUJIMOTO YOSHITAKA (JP)
MURO KEIRO (JP)
YOKOI AKINORI (JP)
SAKAKIBARA HIDEKI (JP)
TSUBAKI SHIGEYASU (JP)
Application Number:
PCT/JP2018/022810
Publication Date:
December 19, 2019
Filing Date:
June 14, 2018
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD (JP)
International Classes:
G01M99/00; G07C3/02
Foreign References:
JP2007024663A2007-02-01
JP2013029507A2013-02-07
JP2007233619A2007-09-13
JP2015219078A2015-12-07
Attorney, Agent or Firm:
SUNNEXT INTERNATIONAL PATENT OFFICE (JP)
Download PDF: