Title:
OPTICAL ANALYZER
Document Type and Number:
WIPO Patent Application WO/2016/117530
Kind Code:
A1
Abstract:
An optical analyzer with which high wavelength resolution is obtained using a simple optical system is obtained. The device comprises: a halogen lamp 101 as a light source; an illuminating system lens 104 constituting an illuminating optical system for illuminating an object being measured, with light from the halogen lamp 101; a mirror 106 which is an optical member having a positional relationship that is coaxial to the illuminating system lens 104, for guiding detection light from between the halogen lamp 101 and the object being measured to an analysis section 109; and a spectroscope 109 as the analysis section for analyzing a material which is the object being measured, on the basis of light received via the mirror 106. At the location of the mirror 106, light traveling from the halogen lamp 101 towards the object being measured passes through the periphery on the optical axis of the illuminating system lens 104, and the light received by the spectroscope 109 passes through the center portion on the optical axis of the illuminating system lens 104.
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Inventors:
YUASA TAICHI (JP)
Application Number:
PCT/JP2016/051366
Publication Date:
July 28, 2016
Filing Date:
January 19, 2016
Export Citation:
Assignee:
TOPCON CORP (JP)
International Classes:
G01N21/359
Domestic Patent References:
| WO2012147488A1 | 2012-11-01 |
Foreign References:
| JP2000258351A | 2000-09-22 | |||
| JPH09210906A | 1997-08-15 | |||
| JPH1144578A | 1999-02-16 | |||
| JPH09250982A | 1997-09-22 |
Attorney, Agent or Firm:
SUENARI, Mikio (JP)
End 成 Mikio (JP)
End 成 Mikio (JP)
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