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Patent Searching and Data


Title:
OPTICAL MICROSCOPE AND IMAGING METHOD
Document Type and Number:
WIPO Patent Application WO/2022/163445
Kind Code:
A1
Abstract:
An optical microscope for diagnosis according to this embodiment comprises: at least one laser light source (11) that generates a laser light for irradiating a sample (40) containing a light-absorbing substance; a lens that focuses the laser light so as to focus the same on the sample (40); a scanning means that changes the focal position of the laser light with respect to the sample (40); and a light detector (31) that detects, as signal light, the laser light that has passed through the sample (40). As a result of the occurrence of saturation of the absorption by the light-absorbing substance when the laser light intensity is maximized, the intensity of the laser light is changed so as to form a non-linear region where the relationship between the laser light intensity and the signal light intensity is non-linear, and an image, based on the saturation of the absorption by the light-absorbing substance, is generated on the basis of a non-linear component of the signal light.

Inventors:
FUJITA KATSUMASA (JP)
NISHIDA KENTARO (JP)
SATO HIKARU (JP)
TANAKA HIDEO (JP)
HARADA YOSHINORI (JP)
Application Number:
PCT/JP2022/001688
Publication Date:
August 04, 2022
Filing Date:
January 19, 2022
Export Citation:
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Assignee:
UNIV OSAKA (JP)
KYOTO PREFECTURAL PUBLIC UNIV CORP (JP)
International Classes:
G01N33/48; G01N21/17; G01N33/483; G02B21/00; G02B21/06
Domestic Patent References:
WO2006061947A12006-06-15
WO2011099269A12011-08-18
Foreign References:
JP2020523615A2020-08-06
JP2015197606A2015-11-09
Attorney, Agent or Firm:
IEIRI Takeshi (JP)
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