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Patent Searching and Data


Title:
PARAMETER DETERMINATION DEVICE, PARAMETER DETERMINATION METHOD, AND PARAMETER DETERMINATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/246247
Kind Code:
A1
Abstract:
The present invention suitably determines soil quality parameters needed for conducting civil engineering and mechanics simulations relating to various foundations. A parameter determination device 1 determines parameters for a particle model which is used by a foundation analysis system, the parameter determination device comprising: a triaxial compression test numerical value analysis unit 12 that determines a parameter so that the adhesive force and the angle of shearing resistance of a virtual foundation respectively match, with a prescribed level of accuracy, the adhesive force and the angle of shearing resistance of a real foundation; and a pull-out test numerical value analysis unit 13 that determines a parameter so that the modulus of subgrade reaction of the virtual foundation matches, with a prescribed level of accuracy, the modulus of subgrade reaction of the real foundation.

Inventors:
MIZUNUMA MAMORU (JP)
MINETA SHINGO (JP)
OKI SHOTA (JP)
HIGASHI YASUHIRO (JP)
OKA SOICHI (JP)
TANIGAKI KENICHI (JP)
Application Number:
PCT/JP2020/020036
Publication Date:
December 10, 2020
Filing Date:
May 21, 2020
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
E02D1/04; E02D9/02; G01N3/00; G01N33/24
Foreign References:
JP2009121078A2009-06-04
JP2018066182A2018-04-26
Other References:
TAKAYUKI ET AL: "A method of determining strength parameters for slope stability analysis by backcalculation and repeated single shear test", TECHNICAL REPORT COLLECTION OF HOKKAIDO BRANCH, JAPANESE GEOTECHNICAL SOCIETY, January 2002 (2002-01-01)
Attorney, Agent or Firm:
MIYOSHI Hidekazu et al. (JP)
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