Title:
PARAMETER DETERMINATION DEVICE, PARAMETER DETERMINATION METHOD, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2021/100163
Kind Code:
A1
Abstract:
Provided is a parameter determination device (3) comprising: a computation means (313) which, on the basis of a result of the recognition of a plurality of images to be recognized (100, 200) performed by a recognition device (2) which carries out a recognition operation on the images to be recognized, computes an evaluation value for evaluating the result of the recognition; and a determination means (314) which, on the basis of the evaluation value, determines image generation parameters (300, 301, 302, 303b) which are used in generating the images to be recognized.
Inventors:
FUNAYAMA CHISATO (JP)
Application Number:
PCT/JP2019/045549
Publication Date:
May 27, 2021
Filing Date:
November 21, 2019
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G06T7/80
Domestic Patent References:
| WO2009066364A1 | 2009-05-28 | |||
| WO2014002398A1 | 2014-01-03 |
Foreign References:
| JP2007310491A | 2007-11-29 | |||
| JP2006268180A | 2006-10-05 | |||
| JP2012198680A | 2012-10-18 | |||
| JP2017130794A | 2017-07-27 |
Other References:
See also references of EP 4064196A4
Attorney, Agent or Firm:
EGAMI, TATSUO et al. (JP)
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