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Patent Searching and Data


Title:
PARTICLE ANALYSIS DEVICE AND PARTICLE ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2017/069250
Kind Code:
A1
Abstract:
In order to be capable of measuring particle magnetization of particles and the characteristics of a plurality of particles, using one device, and in order to be capable of detailed particle analysis, the present invention comprises: a magnetization measurement unit comprising a magnetic field-formation mechanism and a magnetization calculation unit, said magnetic field-formation mechanism forming a magnetic field gradient relative to a dispersion medium including particles, and said magnetization calculation unit calculating the magnetization of said particles on the basis of the magnetophoretic velocity of the particles and the diameter of the particles; and a characteristics analysis unit that performs at least one out of particle diameter distribution measurement, zeta potential measurement, gel structure analysis, molecular weight measurement, elemental analysis, and shape analysis, performing same on particles in the dispersion medium and by using dynamic light scattering or static light scattering at a location where there is substantially no magnetic-field effect caused by the magnetic field-formation mechanism M.

Inventors:
YAMAGUCHI TETSUJI (JP)
NISHIKATA KENTARO (JP)
NAKAYAMA KAHORU (JP)
SAKURAMOTO KEIJIRO (JP)
Application Number:
PCT/JP2016/081301
Publication Date:
April 27, 2017
Filing Date:
October 21, 2016
Export Citation:
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Assignee:
HORIBA LTD (JP)
International Classes:
G01N15/02; G01N27/26; G01N27/76; G01R33/16
Domestic Patent References:
WO2015030184A12015-03-05
Foreign References:
JP2013253882A2013-12-19
JPH07128215A1995-05-19
JP2001505236A2001-04-17
JP2004101325A2004-04-02
JP2012215893A2012-11-08
JPS5112271B11976-04-17
JP2010078469A2010-04-08
Attorney, Agent or Firm:
NISHIMURA, Ryuhei (JP)
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