Title:
PHYSICAL STATE MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/200144
Kind Code:
A1
Abstract:
Provided is a physical state measurement device capable of removing the influence of disturbing noise and stably measuring a physical state. This physical state measurement device comprises a light source unit 10, a main solid material 20, a microwave application unit 30, a detection unit 40, a feedback unit 50, and a static magnetic field application unit 70. The main solid material 20 fluoresces due to excitation light from the light source unit 10. The microwave application unit 30 applies microwaves to the main solid material 20 in order to control the electronic state of the main solid material 20. The detection unit 40 detects the physical state of a measurement target via the fluorescence of the main solid material 20. The feedback unit 50 has a solid material for feedback 51 and a control unit 53. The feedback unit 50 detects the amplitude difference between a low frequency side of a decrease portion, and an operating point of a high-frequency side of a spectrum amplitude centered on the resonance frequency of the electron spin resonance spectrum of the fluorescence of the solid material for feedback 51, and performs feedback control of the microwave application unit 30 so that said difference is zero.
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Inventors:
HATANO YUJI (JP)
IWASAKI TAKAYUKI (JP)
HATANO MUTSUKO (JP)
IWASAKI TAKAYUKI (JP)
HATANO MUTSUKO (JP)
Application Number:
PCT/JP2021/010756
Publication Date:
October 07, 2021
Filing Date:
March 17, 2021
Export Citation:
Assignee:
TOKYO INST TECH (JP)
International Classes:
G01R33/26; G01N21/64; G01N24/10
Domestic Patent References:
| WO2020047006A1 | 2020-03-05 | |||
| WO2018155504A1 | 2018-08-30 | |||
| WO2020080362A1 | 2020-04-23 |
Foreign References:
| US20180136291A1 | 2018-05-17 | |||
| JP2017162910A | 2017-09-14 | |||
| JP2018195324A | 2018-12-06 |
Attorney, Agent or Firm:
NAMAI, Kazuhira (JP)
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