Title:
POLISHING COMPOSITION AND POLISHING METHOD
Document Type and Number:
WIPO Patent Application WO/2016/051659
Kind Code:
A1
Abstract:
For the polishing of polysilicon-containing substrates, provided are a polishing composition and a polishing method capable of suppressing the rate of polishing polysilicon and selectively polishing silicon compounds other than polysilicon, particularly silicon nitride. A polishing composition containing abrasive grains, an organic acid, and a conjugate base of the organic acid is used as the polishing composition.
More Like This:
Inventors:
ISHIDA YASUTO (TW)
Application Number:
PCT/JP2015/004378
Publication Date:
April 07, 2016
Filing Date:
August 28, 2015
Export Citation:
Assignee:
FUJIMI INC (JP)
International Classes:
C09K3/14; B24B37/00; C09G1/02; H01L21/304
Foreign References:
JP2005034986A | 2005-02-10 | |||
JP2005014204A | 2005-01-20 | |||
JP2005023313A | 2005-01-27 | |||
JP2001131535A | 2001-05-15 | |||
JP2002020732A | 2002-01-23 | |||
JP2009227893A | 2009-10-08 | |||
JP2007168034A | 2007-07-05 | |||
JP2007103457A | 2007-04-19 | |||
CN102358824A | 2012-02-22 | |||
JP2015137297A | 2015-07-30 |
Attorney, Agent or Firm:
MORI, Tetsuya et al. (JP)
Woods Tetsuya (JP)
Woods Tetsuya (JP)
Download PDF:
Previous Patent: HEAT TRANSPORT SYSTEM
Next Patent: METHOD FOR DETECTING POOR BONDING PORTION AND INSPECTION SYSTEM
Next Patent: METHOD FOR DETECTING POOR BONDING PORTION AND INSPECTION SYSTEM