PROBE PIN AND ELECTRONIC DEVICE EMPLOYING SAME - OMRON TATEISI ELECTRONICS CO

Title:

PROBE PIN AND ELECTRONIC DEVICE EMPLOYING SAME

Document Type and Number:

WIPO Patent Application WO/2017/179320

Kind Code:

A1

Abstract:

A probe pin (10) is provided with: a coil spring (11) which extends and contracts along a centerline; a first contact (25) which has a rectangular cross section and is disposed at one end on the centerline; and a second contact (34) which has a rectangular cross section and is disposed at the other end on the centerline; wherein the first contact (25) and the second contact (34) are electrically connected to one another and are supported in such a way as to be capable of reciprocating by way of the coil spring (11). In particular, a contact surface of at least one of the first contact (25) and the second contact (34) is inclined in such a way as to descend in a thickness direction (Y1-Y2 direction).

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Inventors:

TERANISHI HIROTADA (JP)
SAKAI TAKAHIRO (JP)
KONDO MAKOTO (JP)
KIMURA NAOYUKI (JP)

Application Number:

PCT/JP2017/007497

Publication Date:

October 19, 2017

Filing Date:

February 27, 2017

Export Citation:

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Assignee:

OMRON TATEISI ELECTRONICS CO (JP)

International Classes:

G01R1/067; H01R13/24; H01R33/76

Foreign References:

JP2012520461A	2012-09-06
JP2015040734A	2015-03-02
JP2015076325A	2015-04-20
JPH10221367A	1998-08-21

Other References: