Title:
PROBE PIN AND INSPECTION UNIT
Document Type and Number:
WIPO Patent Application WO/2018/168136
Kind Code:
A1
Abstract:
The present invention is provided with a coil spring that expands and contracts along a center line and a first plunger and second plunger that are disposed serially with the coil spring on both sides of the direction following the center line of the coil spring. The wire of the coil spring has a cross-sectional shape that is oblong along the center line, and when the coil spring is compressed, inter-coil distances are reduced within the wire of the coil spring having the oblong cross-sectional shape and a transmission path for a signal flowing along the direction of extension of the center line is formed along the outer periphery of the coil spring.
Inventors:
TERANISHI HIROTADA (JP)
DANNO MASAFUMI (JP)
SAKAI TAKAHIRO (JP)
DANNO MASAFUMI (JP)
SAKAI TAKAHIRO (JP)
Application Number:
PCT/JP2017/044908
Publication Date:
September 20, 2018
Filing Date:
December 14, 2017
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01R1/067; H01R12/51; H01R13/24
Foreign References:
| JP2015040734A | 2015-03-02 | |||
| JP3027159U | 1996-07-30 | |||
| JP2016125943A | 2016-07-11 | |||
| JP2009186210A | 2009-08-20 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
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