PRODUCT INSPECTION DEVICE, PRODUCT INSPECTION METHOD, AND COMPUTER PROGRAM

WIPO Patent Application WO/2010/137488

A1

Disclosed are a product inspection device, a product inspection method, and a computer program, wherein a product can be inspected on the basis of consumer's risk and producer's risk. Specifically disclosed is a product inspection device which is provided with a measurement unit (1), a deemed standard deviation calculation unit (3), a measured value standard deviation calculation unit (4), a determination unit (5), and a risk calculation unit (6). The measurement unit (1) measures the characteristic values of products (10), the deemed standard deviation calculation unit (3) calculates deemed standard deviation, and the risk calculation unit (6) calculates the consumer's risk and the producer's risk on the basis of at least one of the average value of the characteristic values of some of the products (10) included in a measured product lot (11), the deemed standard deviation, or the measured value standard deviation. The determination unit (5) changes inspection standards on the basis of at least either the calculated consumer's risk or producer's risk, and determines whether or not all the products (10) included in the product lot (11) are non-defective products according to the changed inspection standards as the reference.

TSURU TERUHISA (JP)

PCT/JP2010/058325

December 02, 2010

May 18, 2010

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MURATA MANUFACTURING CO (JP)
TSURU TERUHISA (JP)

G06Q10/00

JPH08274139A	1996-10-18
JPH0352247A	1991-03-06
JP2007139621A	2007-06-07

FUKUNAGA Masaya (JP)
Masaya Fukunaga (JP)

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