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Patent Searching and Data


Title:
RESIN ADHESION FAILURE DETECTION
Document Type and Number:
WIPO Patent Application WO/2021/108233
Kind Code:
A3
Abstract:
Methods to in-situ monitor production of additive manufacturing products collects images from the deposition process on a layer-by-layer basis, including a void image of the pattern left in a slurry layer after deposition of a layer and a displacement image formed by immersing the just-deposited layer in a renewed slurry layer. Image properties of the void image and displacement image are corrected and then compared to a binary expected image from a computer generated model to identify defects in the just-deposited layer on a layer-by-layer basis. Additional methods use the output from the comparison to form a 3D model corresponding to at least a portion of the additive manufacturing product. Components to control the additive manufacturing operation based on digital model data and to in-situ monitor successive layers for manufacturing defects can be embodied in a computer system or computer-aided machine, such as a computer controlled additive manufacturing machine.

Inventors:
KITCHEN RYAN SCOTT (US)
FISHER BENJAMIN D (US)
Application Number:
PCT/US2020/061411
Publication Date:
June 24, 2021
Filing Date:
November 20, 2020
Export Citation:
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Assignee:
BWXT ADVANCED TECH LLC (US)
International Classes:
B05D7/22; B05C13/02
Foreign References:
US20070212483A12007-09-13
US20070089479A12007-04-26
US20180322621A12018-11-08
US20180341248A12018-11-29
Other References:
PARK ET AL.: "In-process Layer Surface Inspection of SLA Products", PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, December 1998 (1998-12-01), XP002684003
Attorney, Agent or Firm:
KILLIAN, Jeffrey G. et al. (US)
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