Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
RESISTANCE VALUE ACQUISITION CIRCUIT, METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/029440
Kind Code:
A1
Abstract:
A resistance value acquisition circuit, method and device, the circuit comprising: a working voltage node resistor Rb, a common ground terminal voltage node resistor Rc, a reference node resistor Ra, a first interconnect parasitic resistor Rwire1, a second interconnect parasitic resistor Rwire2, an encapsulation network resistor Rnet, a first diode Dio_VDD, a second diode Dio_Vss and a third diode Dio_die, where the working voltage node resistor Rb is respectively connected to one end of the first interconnect parasitic resistor Rwire1 and one end of the encapsulation network resistor Rnet. The other end of the first interconnect parasitic resistor Rwire1 is connected to the cathode of the first diode Dio_VDD, and the anode of the first diode Dio_VDD is respectively connected to the reference node resistor Ra and the cathode of the second diode Dio_Vss. The anode of the second diode Dio_VSS is respectively connected to the common grounding terminal voltage node resistor Rc and the cathode of the third diode Dio_die via the second interconnect parasitic resistor Rwire2. The anode of the third diode Dio_die is connected to the other end of the encapsulation network resistor Rnet. The circuit is capable of separating and extracting the resistance of each component of a target system, and accurately monitoring the resistance of each component of the system.

More Like This:
JP2004333493INSTRUMENT FOR MEASURING ELECTRICAL RESISTANCE OF CONDUCTIVE MATERIAL AND RESISTANCE OF CONDUCTIVE LAYER, AND METHOD OF MEASURING RESISTANCE OF CONDUCTIVE LAYER AND CALIBRATING RESISTANCE MEASURING INSTRUMENT
Inventors:
SUN NIUYI (CN)
YANG DAN (CN)
MEI NA (CN)
SUN TUOBEI (CN)
Application Number:
PCT/CN2022/081856
Publication Date:
March 09, 2023
Filing Date:
March 19, 2022
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SANECHIPS TECH CO LTD (CN)
International Classes:
G01R27/08
Foreign References:
US20030189436A12003-10-09
CN202903889U2013-04-24
US20190219452A12019-07-18
CN105823976A2016-08-03
US10530324B12020-01-07
CN111914505A2020-11-10
CN104267263A2015-01-07
CN212321726U2021-01-08
Attorney, Agent or Firm:
KANGXIN PARTNERS, P.C. (CN)
Download PDF:
View/Download PDF      PDF Help



 
Previous Patent: BANDWIDTH ALLOCATION METHOD AND APPARATUS, AND AUTHENTICATION METHOD AND SYSTEM FOR HOME NETWORK ONU

Next Patent: DATA READ-WRITE METHOD AND APPARATUS FOR MULTI-PORT MEMORY, AND STORAGE MEDIUM AND ELECTRONIC DEVICE