Title:
SAMPLE ANALYZING DEVICE
Document Type and Number:
WIPO Patent Application WO2010109772
Kind Code:
A1
Abstract:
Increase of reaction speed and determination in a short time may be conceived to shorten measurement time. However, a certain level of reproducibility cannot be ensured since typical photometry using conventional apparatus is conducted once every about 15 seconds. That is, shortening the measurement time and ensuring the reproducibility cannot be achieved simultaneously. Therefore, increasing the number of measurements in a short time has been expected. Until measurement is finished after a sample and a reagent are mixed, a cell disc is operated so that the cell disc is stopped in a photometry position in which photometry is conducted, and photometry is conducted once or a plurality of times during the stop. Thus the number of measurements is increased.
Inventors:
ADACHI SAKUICHIRO (JP)
MAKINO AKIHISA (JP)
MAKINO AKIHISA (JP)
Application Number:
PCT/JP2010/001351
Publication Date:
September 30, 2010
Filing Date:
March 01, 2010
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
ADACHI SAKUICHIRO (JP)
MAKINO AKIHISA (JP)
ADACHI SAKUICHIRO (JP)
MAKINO AKIHISA (JP)
International Classes:
G01N35/02; G01N35/00; G01N35/04
Foreign References:
| JP2001235422A | 2001-08-31 | |||
| JP2001208760A | 2001-08-03 | |||
| JP2666568B2 | 1997-10-22 | |||
| JPS61218949A | 1986-09-29 | |||
| JPS5782769A | 1982-05-24 |
Attorney, Agent or Firm:
INOUE, MANABU (JP)
Manabu Inoue (JP)
Manabu Inoue (JP)
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