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Title:
SECONDARY CELL INSPECTION METHOD AND SECONDARY CELL INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/210346
Kind Code:
A1
Abstract:
Provided is a secondary cell inspection device with which it is possible to improve inspection accuracy of a secondary cell while also simplifying the inspection thereof. A model parameter value of a secondary cell model is identified on the basis of a sampling rate T. The secondary cell model expresses internal resistance impedance for a secondary cell 200 using an IIR transfer function and a FIR transfer function. A model output voltage is estimated as a mode of voltage variation outputted from an assignment model when an impulse current (t) is inputted to said assignment model, which is the secondary cell model in which the model parameter value is identified. On the basis of a voltage measurement result for the secondary cell 200 when the impulse current I(t) flows through said secondary cell 200, and on the basis of the assignment model output voltage, the performance of the secondary cell 200 based on the sampling rate T is assessed.

Inventors:
MUNAKATA ICHIRO (JP)
TANNO SATOSHI (JP)
SHOJI HIDEKI (JP)
Application Number:
PCT/JP2021/011440
Publication Date:
October 21, 2021
Filing Date:
March 19, 2021
Export Citation:
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Assignee:
TOYO SYSTEM CO LTD (JP)
International Classes:
G01R31/392; G01R31/367; G01R31/374; H01M10/48
Domestic Patent References:
WO2017002953A12017-01-05
WO2019187264A12019-10-03
Foreign References:
US20140372054A12014-12-18
US20110060538A12011-03-10
JP6842212B12021-03-17
JPS5924617B21984-06-11
Attorney, Agent or Firm:
SATO & ASSOCIATES (JP)
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