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Patent Searching and Data


Title:
SENSOR ELEMENT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/071383
Kind Code:
A1
Abstract:
To enhance the measurement sensitivity of measurement using F-centers in a sensor, this sensor element (1) is made to have F-centers in a diamond crystal structure, and the electron spin states of the F-centers are made to be dressed states.

Inventors:
MIZUOCHI NORIKAZU (JP)
MORISHITA HIROKI (JP)
TASHIMA TOSHIYUKI (JP)
Application Number:
PCT/JP2019/038794
Publication Date:
April 09, 2020
Filing Date:
October 01, 2019
Export Citation:
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Assignee:
UNIV KYOTO (JP)
International Classes:
G01R33/20; G01N24/00; G01N24/10; G01R33/26
Domestic Patent References:
WO2015107907A12015-07-23
Foreign References:
JP2018514795A2018-06-07
US20160054402A12016-02-25
US20160061914A12016-03-03
JP2017514130A2017-06-01
JP2019152524A2019-09-12
Attorney, Agent or Firm:
SAEGUSA & PARTNERS (JP)
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