Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
SPECIMEN PROCESSING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/142497
Kind Code:
A1
Abstract:
A specimen processing system 100 for pre-processing or analyzing a specimen is provided with sensors 5a, 5b, ... which detect a drive state of drive equipment installed in the system, an abnormality detecting unit 3a which determines, from signal waveforms detected by the sensors 5a, 5b, ..., whether an abnormality has occurred in the drive equipment, and a recording device which sequentially records the signal waveforms detected by the sensors 5a, 5b, ..., and stores, in an non-erasable area, the sensor signals waveform before and after the occurrence of an operational abnormality if the abnormality detecting unit 3a has determined that an abnormality has occurred. The present invention thus provides a specimen processing system with which it is possible for recovery from the occurrence of an abnormality to be achieved more quickly that in the past.

Inventors:
BABA SHUNSUKE (JP)
ONIZAWA KUNIAKI (JP)
Application Number:
PCT/JP2018/043415
Publication Date:
July 25, 2019
Filing Date:
November 26, 2018
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00
Domestic Patent References:
WO2016147714A12016-09-22
Foreign References:
JP2013148445A2013-08-01
JP2007225525A2007-09-06
JP2010048758A2010-03-04
JP2004219352A2004-08-05
JP2009210318A2009-09-17
JP2006071359A2006-03-16
JP2008002898A2008-01-10
Other References:
See also references of EP 3742169A4
Attorney, Agent or Firm:
KAICHI IP (JP)
Download PDF: