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Title:
STORAGE CELL DIAGNOSTIC DEVICE AND STORAGE CELL DIAGNOSTIC METHOD, AND STORAGE CELL CONTROL SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/202752
Kind Code:
A1
Abstract:
The present invention is provided with: a positive/negative-electrode OCV model function generating unit 106 for generating a negative-electrode OCV model function and a positive-electrode OCV model function corresponding to N storage cells from a sum of OCV element functions using time series data stored in a data storage unit 104; and a storage cell model function parameter group estimation unit 107 for generating a storage cell model function on the basis of the positive-electrode OCV model function and the negative-electrode OCV model function, generating an evaluation function L indicating an error between the time series data in the data storage unit 104 and time series data of estimated data calculated using the storage cell model function, and calculating a group of optimum estimated parameters of the storage cell model function corresponding to the storage cells such that the value of the evaluation function L is small.

Inventors:
TAKEGAMI TOMOKI (JP)
WADA TOSHIHIRO (JP)
Application Number:
PCT/JP2018/029960
Publication Date:
October 24, 2019
Filing Date:
August 09, 2018
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01R31/36; H01M10/48
Domestic Patent References:
WO2011125213A12011-10-13
Foreign References:
JP2014025739A2014-02-06
JP2017166874A2017-09-21
JP2018046667A2018-03-22
JP2013217819A2013-10-24
JP2014003777A2014-01-09
JP2015527566A2015-09-17
US20160099488A12016-04-07
US20150100259A12015-04-09
US20160006275A12016-01-07
Attorney, Agent or Firm:
SOGA, Michiharu et al. (JP)
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