Title:
SUBSTANCE WETTABILITY DISTRIBUTION ASSESSMENT METHOD AND ASSESSMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/034348
Kind Code:
A1
Abstract:
Provided is a method capable of assessing non-uniformity (wettability distribution) in the wettability of a substance surface. This substance wettability distribution assessment method involves: spraying a gas at a liquid covering the surface of a substance; obtaining, while spraying the gas, image information for a region (liquid removal region) where the liquid is removed from the substance surface as a result of being sprayed by the gas; and assessing the substance wettability distribution on the basis of the image information.
Inventors:
TANAKA NOBUYUKI (JP)
NAKANISHI YUKI (JP)
TAKAHARA JUNKO (JP)
AWAZU AKANE (JP)
TANAKA YO (JP)
HARUZONO YOSHIHIDE (JP)
NASU HIROMITSU (JP)
NAKANISHI YUKI (JP)
TAKAHARA JUNKO (JP)
AWAZU AKANE (JP)
TANAKA YO (JP)
HARUZONO YOSHIHIDE (JP)
NASU HIROMITSU (JP)
Application Number:
PCT/JP2017/029669
Publication Date:
February 22, 2018
Filing Date:
August 18, 2017
Export Citation:
Assignee:
RIKEN (JP)
KITAGAWA IRON WORKS CO (JP)
KITAGAWA IRON WORKS CO (JP)
International Classes:
G01N13/00
Domestic Patent References:
WO2013176264A1 | 2013-11-28 |
Foreign References:
JP2007040730A | 2007-02-15 | |||
US8474306B1 | 2013-07-02 |
Other References:
NOBUYUKI TANAKA ET AL.: "Automation of Non-Contact Wettability Assessment System", JAPAN SOCIETY OF MECHANICAL ENGINEERS CONFERENCE ON ROBOTICS AND MECHATRONICS KOEN RONBUNSHU, vol. 2016, 8 June 2016 (2016-06-08), pages lAl-19b3
R.UCHIDA ET AL.: "Cell Sheet Stiffness Sensing without Taking out from Culture Liquid", 32ND ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE EMBS, 31 August 2010 (2010-08-31), pages 827 - 830, XP032108730
R.UCHIDA ET AL.: "Cell Sheet Stiffness Sensing without Taking out from Culture Liquid", 32ND ANNUAL INTERNATIONAL CONFERENCE OF THE IEEE EMBS, 31 August 2010 (2010-08-31), pages 827 - 830, XP032108730
Attorney, Agent or Firm:
IKEUCHI SATO & PARTNER PATENT ATTORNEYS (JP)
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