Title:
SUBSTRATE FOR USE IN ANALYSIS OF NUCLEIC ACID, FLOW CELL FOR USE IN ANALYSIS OF NUCLEIC ACID, AND NUCLEIC ACID ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/103473
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide: a substrate for use in the analysis of a nucleic acid, which, even when the alignment of one analysis area is performed repeatedly, can identify the position of the analysis area with high reproducibility; and a flow cell for use in the analysis of a nucleic acid and a nucleic acid analysis device, each of which is equipped with the substrate for use in the analysis of a nucleic acid. The substrate 100 for use in the analysis of a nucleic acid according to the present invention has multiple analysis areas 12 which are partitioned on a substrate 10, and enables the measurement of the analysis areas 12 while interchanging the analysis areas 12 in turn, said substrate 100 being characterized in that each of the analysis areas 12 consists of an adsorption part 13 onto which a DNA fragment or a carrier having the DNA fragment carried thereon can be adsorbed and a non-adsorption part 14 which is a part outside of the adsorption part 13, and the non-adsorption part 14 has, formed on at least a part thereof, a marker part 15 that has a specified shape and helps to identify the positions of the analysis areas 12.
Inventors:
OTA YUICHIRO (JP)
SHOJI TOMOHIRO (JP)
YOKOYAMA TORU (JP)
NARAHARA MASATOSHI (JP)
SHOJI TOMOHIRO (JP)
YOKOYAMA TORU (JP)
NARAHARA MASATOSHI (JP)
Application Number:
PCT/JP2014/084584
Publication Date:
June 30, 2016
Filing Date:
December 26, 2014
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
C12Q1/68; G01B11/00; G01N33/53; G01N37/00
Domestic Patent References:
| WO2014148419A1 | 2014-09-25 |
Foreign References:
| JP2013527848A | 2013-07-04 | |||
| JP2014020832A | 2014-02-03 | |||
| JP2013150568A | 2013-08-08 | |||
| JP2003307518A | 2003-10-31 |
Attorney, Agent or Firm:
WILLFORT INTERNATIONAL PATENT FIRM (JP)
Patent business corporation Wil photograph international patent firm (JP)
Patent business corporation Wil photograph international patent firm (JP)
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