Title:
SURFACE LAYER DISRUPTION AND IONIZATION UTILIZING AN EXTREME ULTRAVIOLET RADIATION SOURCE
Document Type and Number:
WIPO Patent Application WO/2019/147748
Kind Code:
A3
Abstract:
A surface ionizer for a trace detection system includes an extreme ultraviolet light source and an ion transfer line. Activation of the extreme ultraviolet light disrupts a surface of a sample along with residue and ionizes the resulting vapor. The ionized vapor is collected in the ion transfer line and passed into an analysis device for detection of components in the vapor.
Inventors:
VERKERK UDO (CA)
ROMANOV VLADIMIR (US)
JENNINGS ALISON (CA)
LAI HANH (US)
HOPKINSON ALAN (CA)
ROMANOV VLADIMIR (US)
JENNINGS ALISON (CA)
LAI HANH (US)
HOPKINSON ALAN (CA)
Application Number:
PCT/US2019/014872
Publication Date:
September 19, 2019
Filing Date:
January 24, 2019
Export Citation:
Assignee:
RAPISCAN SYSTEMS INC (US)
International Classes:
H01J27/26; H01J49/04; H01J49/10; H01J49/14; H01J49/16; H01J49/26
Domestic Patent References:
| WO2016179291A1 | 2016-11-10 |
Foreign References:
| CN103797559A | 2014-05-14 | |||
| US20150292077A1 | 2015-10-15 | |||
| US6726886B2 | 2004-04-27 | |||
| US20150371807A1 | 2015-12-24 |
Attorney, Agent or Firm:
DALAL, Sona (US)
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