Title:
SYSTEM FOR ASSESSING CAUSE OF DAMAGE TO STRUCTURE, METHOD FOR ASSESSING CAUSE OF DAMAGE, AND SERVER FOR ASSESSING CAUSE OF DAMAGE
Document Type and Number:
WIPO Patent Application WO/2020/110717
Kind Code:
A1
Abstract:
Provided are a system for assessing a cause of damage to a structure, a method for assessing a cause of damage, and a server for assessing a cause of damage that make it possible to assess a cause of damage with a high degree of probability. The system (100) for assessing a cause of damage to a structure is provided with: a database (110) including captured images of structures and data relating to causes of damage; an image acquisition unit (115) that acquires a captured image of a target structure to be inspected; a damage detection unit (125) that detects damage from the captured image; a similar damage extraction unit (130) that uses the database (110) to extract similar damage similar to the aforementioned damage; and a cause of damage presentation unit (135) that presents the cause of damage of the similar damage. Also provided are a method for assessing a cause of damage using the system (100) for assessing a cause of damage to a structure, and a server for assessing a cause of damage.
Inventors:
HORITA SHUHEI (JP)
Application Number:
PCT/JP2019/044449
Publication Date:
June 04, 2020
Filing Date:
November 13, 2019
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
G06F16/53; E01D22/00; G06F16/903; G06Q50/08
Domestic Patent References:
| WO2017056804A1 | 2017-04-06 |
Foreign References:
| JPH0843316A | 1996-02-16 | |||
| JP2012225889A | 2012-11-15 | |||
| JP2015095143A | 2015-05-18 | |||
| JP4006007B2 | 2007-11-14 |
Other References:
See also references of EP 3889801A4
Attorney, Agent or Firm:
NAKASHIMA Junko et al. (JP)
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