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Patent Searching and Data


Title:
SYSTEM AND METHOD FOR OBJECT RECOGNITION USING FLUORESCENT AND ANTIREFLECTIVE SURFACE CONSTRUCTS
Document Type and Number:
WIPO Patent Application WO/2020/245443
Kind Code:
A3
Abstract:
The present invention refers to a system and a method for object recognition via a computer vision application, the system comprising at least the following components: - at least one object (110) to be recognized, the object having object specific reflectance and luminescence spectral patterns, - a light source (140) which is configured to illuminate a scene including the at least one object under ambient lighting conditions, - a sensor (150) which is configured to measure radiance data of the scene including the at least one object when the scene is illuminated by the light source, - a linear polarizer (120) coupled with a quarter waveplate (130), the quarter waveplate (130) being oriented with its fast and slow axes at an angle in the range of 40 to 50 degrees, preferably of 42 to 48 degrees, more preferably of 44 to 46 degrees relative to the linear polarizer (120), the linear polarizer (120) and the quarter waveplate (130) being positioned between the sensor (150) and the at least one object (110), and between the light source (140) and the at least one object (110), - a data storage unit which comprises luminescence spectral patterns together with appropriately assigned respective objects, - a data processing unit which is configured to detect the object specific luminescence spectral pattern of the at least one object to be recognized out of the measured radiance data of the scene and to match the detected object specific luminescence spectral pattern with the luminescence spectral patterns stored in the data storage unit, and to identify a best matching luminescence spectral pattern and, thus, its assigned object.

Inventors:
KURTOGLU YUNUS EMRE (US)
CHILDERS MATTHEW IAN (US)
Application Number:
PCT/EP2020/065750
Publication Date:
March 18, 2021
Filing Date:
June 05, 2020
Export Citation:
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Assignee:
BASF COATINGS GMBH (DE)
International Classes:
G06K9/20; G02B5/30; G02F1/13363
Foreign References:
US20170372113A12017-12-28
Other References:
ZHANG XIAOMIN ET AL: "Microstructure analysis of silk samples using mueller matrix determination and sparse representation", 2017 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP), IEEE, 17 September 2017 (2017-09-17), pages 4108 - 4112, XP033323348, DOI: 10.1109/ICIP.2017.8297055
Attorney, Agent or Firm:
RAIBLE DEISSLER LEHMANN PATENTANWÄLTE (DE)
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