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Patent Searching and Data


Title:
TEMPERATURE CHARACTERISTIC ADJUSTMENT CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2018/123188
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a temperature characteristic adjustment circuit capable of making an adjustment to various positive/negative temperature characteristics with extremely small characteristic variation, and suppressing an increase in chip area and current consumption with a simple circuit structure. A temperature characteristic adjustment circuit (1) is provided with: a current source having a nonvolatile memory element (M) which has a control gate region (CG) and a source region (S) and is driven by means of a bias applied between the control gate region (CG) and the source region (S); and an output circuit (6) in which the temperature dependency of an output signal due to the temperature dependency of current amount of a current output from the current source is adjusted by the nonvolatile memory element (M), and which does not have a nonvolatile memory element.

Inventors:
SAKAMOTO TOSHIRO (JP)
TSUSHIMA YUUKOU (JP)
Application Number:
PCT/JP2017/036031
Publication Date:
July 05, 2018
Filing Date:
October 03, 2017
Export Citation:
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Assignee:
ASAHI KASEI MICRODEVICES CORP (JP)
International Classes:
G11C16/30; G05F3/24; H01L21/336; H01L27/115; H01L29/788; H01L29/792
Foreign References:
JPH05119859A1993-05-18
JP2010170533A2010-08-05
JP2015171258A2015-09-28
JP2016129293A2016-07-14
JP2001035177A2001-02-09
Other References:
See also references of EP 3547069A4
Attorney, Agent or Firm:
MORI Tetsuya et al. (JP)
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