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Title:
TEMPERATURE MEASUREMENT DEVICE CALIBRATION METHOD, TEMPERATURE MEASUREMENT DEVICE CALIBRATION DEVICE, PHYSICAL QUANTITY MEASUREMENT DEVICE CALIBRATION METHOD, AND PHYSICAL QUANTITY MEASUREMENT DEVICE CALIBRATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/105255
Kind Code:
A1
Abstract:
This temperature measurement device calibration method includes a step for: using a temperature measurement device before a change and the temperature measurement device after the change to measure dark current data and spectrum information for the energy radiated by a blackbody furnace at each of a plurality of different temperatures; using the measured information to generate, from temperature measurement values measured for the temperature measurement device before the change by a contact thermometer and the spectrum information corresponding to the temperature measurement values, temperature measurement values measured for the temperature measurement device after the change using the contact thermometer and the spectrum information corresponding to the temperature measurement values; and using the generated information to determine a base spectrum and calibration curve for the temperature measurement device after the change.

Inventors:
KEMMOCHI MITSUTOSHI (JP)
Application Number:
PCT/JP2019/036129
Publication Date:
May 28, 2020
Filing Date:
September 13, 2019
Export Citation:
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Assignee:
JFE STEEL CORP (JP)
International Classes:
G01J5/00; G01J5/60
Foreign References:
JP2013221788A2013-10-28
JP2013127378A2013-06-27
JP2013234984A2013-11-21
JP2014169935A2014-09-18
JP2013170946A2013-09-02
US20150124244A12015-05-07
JP2012008062A2012-01-12
JP2014134527A2014-07-24
JP2012142920A2012-07-26
JP2013234984A2013-11-21
JP2013221788A2013-10-28
JP2014169935A2014-09-18
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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