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Title:
TEMPERATURE MEASURING METHOD, TEMPERATURE MEASURING APPARATUS, TEMPERATURE CONTROL METHOD, TEMPERATURE CONTROL APPARATUS, CORRECTION METHOD AND CORRECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2010/013720
Kind Code:
A1
Abstract:
Provided is a temperature measuring method wherein the temperature of a sheet-like body can be accurately measured even in the case where the temperature distribution of the sheet-like body is nonuniform.  In the temperature measuring method, the temperature of a physical quantity measuring area (S) or that in the vicinity of the measuring area is measured at the time of measuring the physical quantities of a sheet-like body (a) by means of a physical quantity measuring means.  On one side or on the both sides of the sheet-like body (a), which moves relatively to a temperature sensor (11) in proximity to the temperature sensor (11) in the predetermined direction, a measuring space (T), which is substantially closed by a curtain formed of an airflow jetted toward the sheet-like body (a) such that the temperature sensor (11) is surrounded, is formed, and the measuring area (S) is arranged in the measuring space.  Thus, the temperature of the measuring area (S) or that in the vicinity of the measuring area is measured within the measuring space by means of the temperature sensor (11).

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Inventors:
TOJO FUMIO (JP)
HIRAKAWA SHUNZO (JP)
TOYODA TOSHIYASU (JP)
IGUCHI MASARU (JP)
KATAYAMA YUSUKE (JP)
Application Number:
PCT/JP2009/063441
Publication Date:
February 04, 2010
Filing Date:
July 28, 2009
Export Citation:
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Assignee:
YAMABUN ELECTRONICS CO LTD (JP)
TOJO FUMIO (JP)
HIRAKAWA SHUNZO (JP)
TOYODA TOSHIYASU (JP)
IGUCHI MASARU (JP)
KATAYAMA YUSUKE (JP)
International Classes:
G01K1/20; G01B21/08; G01D3/028; G01K13/02; B29C55/02
Foreign References:
JPH10170220A1998-06-26
JP2005030920A2005-02-03
JPH09159438A1997-06-20
JPS55155905U1980-11-10
JPH09159438A1997-06-20
Other References:
See also references of EP 2320207A4
Attorney, Agent or Firm:
TANAKA Hideyoshi et al. (JP)
Hideyoshi Tanaka (JP)
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